"A Generalized Approach to Determine the Switching Reliability of GaN HEMTs ..."

Nicola Modolo et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405142

access: closed

type: Conference or Workshop Paper

metadata version: 2025-07-04

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Nicola Modolo, Andrea Minetto, Carlo De Santi, Luca Sayadi, Sebastien Sicre, Gerhard Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini:
A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level. IRPS 2021: 1-5

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