"A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA ..."

Yi Cai et al. (2005)

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DOI: 10.1109/TEST.2005.1584026

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yi Cai, Amit Bhattacharyya, Joe Martone, Anant Verma, William Burchanowski:
A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA - based on AWG and undersampling techniques. ITC 2005: 8

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