"A Layout Driven Design for Testability Technique for MOS VLSI Circuits."

Sungho Kim, Prithviraj Banerjee, Srinivas Patil (1991)

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DOI: 10.1109/TEST.1991.519506

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Sungho Kim, Prithviraj Banerjee, Srinivas Patil:
A Layout Driven Design for Testability Technique for MOS VLSI Circuits. ITC 1991: 157-165

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