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"Reliability analysis of InGaN Blu-Ray laser diode."

Nicola Trivellin et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.002

access: closed

type: Journal Article

metadata version: 2024-05-07

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  - https://dblp.org/rec/journals/mr/TrivellinMMZOYTU09
Nicola Trivellin, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda:
Reliability analysis of InGaN Blu-Ray laser diode. Microelectron. Reliab. 49(9-11): 1236-1239 (2009)

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