"Process and Reliability Sensors for Nanoscale CMOS."

John Keane et al. (2012)

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DOI: 10.1109/MDT.2012.2211561

access: closed

type: Journal Article

metadata version: 2020-05-17

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John Keane, Chris H. Kim, Qunzeng Liu, Sachin S. Sapatnekar:
Process and Reliability Sensors for Nanoscale CMOS. IEEE Des. Test Comput. 29(5): 8-17 (2012)

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