"Scalable Test Generators for High-Speed Datapath Circuits."

Hussain Al-Asaad, John P. Hayes, Brian T. Murray (1998)

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DOI: 10.1023/A:1008242108853

access: closed

type: Journal Article

metadata version: 2020-09-11

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Hussain Al-Asaad, John P. Hayes, Brian T. Murray:
Scalable Test Generators for High-Speed Datapath Circuits. J. Electron. Test. 12(1-2): 111-125 (1998)

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