"Analysis of Schottky gate degradation evolution in AlGaN/GaN HEMTs during ..."

Laurent Brunel et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.095

access: closed

type: Journal Article

metadata version: 2020-02-22

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Laurent Brunel, Benoit Lambert, P. Mezenge, J. Bataille, D. Floriot, Jan Grünenpütt, Hervé Blanck, D. Carisetti, Y. Gourdel, Nathalie Malbert, Arnaud Curutchet, Nathalie Labat:
Analysis of Schottky gate degradation evolution in AlGaN/GaN HEMTs during HTRB stress. Microelectron. Reliab. 53(9-11): 1450-1455 (2013)

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