"Investigation on CDM ESD events at core circuits in a 65-nm CMOS process."

Chun-Yu Lin, Tang-Long Chang, Ming-Dou Ker (2012)

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DOI: 10.1016/J.MICROREL.2012.04.021

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type: Journal Article

metadata version: 2025-03-03

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Chun-Yu Lin, Tang-Long Chang, Ming-Dou Ker:
Investigation on CDM ESD events at core circuits in a 65-nm CMOS process. Microelectron. Reliab. 52(11): 2627-2631 (2012)

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