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ORCID"Investigation on CDM ESD events at core circuits in a 65-nm CMOS process."
Chun-Yu Lin, Tang-Long Chang, Ming-Dou Ker (2012)
- Chun-Yu Lin, Tang-Long Chang, Ming-Dou Ker:
Investigation on CDM ESD events at core circuits in a 65-nm CMOS process. Microelectron. Reliab. 52(11): 2627-2631 (2012)
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