"Assessment methodology of the lateral migration component in data ..."

Lifang Liu et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.070

access: closed

type: Journal Article

metadata version: 2021-02-24

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Lifang Liu, Antonio Arreghini, Geert Van den Bosch, Liyang Pan, Jan Van Houdt:
Assessment methodology of the lateral migration component in data retention of 3D SONOS memories. Microelectron. Reliab. 54(9-10): 1697-1701 (2014)

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