"Thermally-activated degradation of InGaN-based laser diodes: Effect on ..."

Carlo De Santi et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.073

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type: Journal Article

metadata version: 2024-05-07

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Carlo De Santi, Matteo Meneghini, Michael Marioli, Matteo Buffolo, Nicola Trivellin, T. Weig, K. Holc, K. Köhler, J. Wagner, U. T. Schwarz, Gaudenzio Meneghesso, Enrico Zanoni:
Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage. Microelectron. Reliab. 54(9-10): 2147-2150 (2014)

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