"A Highly Reliable Dual-Mode RRAM PUF With Key Concealment Scheme."

Jiang Li et al. (2025)

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DOI: 10.1109/TCAD.2025.3536376

access: closed

type: Journal Article

metadata version: 2025-08-09

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  - https://dblp.org/rec/journals/tcad/LiCGWLK25
Jiang Li, Yijun Cui, Chongyan Gu, Chenghua Wang, Weiqiang Liu, Shahar Kvatinsky:
A Highly Reliable Dual-Mode RRAM PUF With Key Concealment Scheme. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(8): 2870-2882 (2025)

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