"A Novel Approach to Perform Gate-Level Yield Analysis and Optimization ..."

Ashish Srivastava et al. (2008)

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DOI: 10.1109/TCAD.2007.907227

access: closed

type: Journal Article

metadata version: 2020-09-24

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Ashish Srivastava, Kaviraj Chopra, Saumil Shah, Dennis Sylvester, David T. Blaauw:
A Novel Approach to Perform Gate-Level Yield Analysis and Optimization Considering Correlated Variations in Power and Performance. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2): 272-285 (2008)

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