default search action
- Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara:
Improving test effectiveness of scan-based BIST by scan chain partitioning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(6): 916-927 (2005)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.