"Improving test effectiveness of scan-based BIST by scan chain partitioning."

Dong Xiang et al. (2005)

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DOI: 10.1109/TCAD.2005.847943

access: closed

type: Journal Article

metadata version: 2020-09-24

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Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara:
Improving test effectiveness of scan-based BIST by scan chain partitioning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(6): 916-927 (2005)

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