"Outer-Loop Admittance and Motion Control Dual Improvement via a ..."

Kangwagye Samuel et al. (2024)

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DOI: 10.1109/TIE.2023.3317843

access: closed

type: Journal Article

metadata version: 2024-05-04

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Kangwagye Samuel, Kevin Haninger, Roberto Oboe, Sehoon Oh:
Outer-Loop Admittance and Motion Control Dual Improvement via a Multi-Function Observer. IEEE Trans. Ind. Electron. 71(8): 9339-9350 (2024)

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