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"Exploiting Intracell Bit-Error Characteristics to Improve Min-Sum LDPC ..."

Hongbin Sun et al. (2016)

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DOI: 10.1109/TVLSI.2016.2535224

access: closed

type: Journal Article

metadata version: 2020-08-26

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  dblp key:
  - journals/tvlsi/SunZLDZ016
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  - https://dblp.org/rec/journals/tvlsi/SunZLDZ016
Hongbin Sun, Wenzhe Zhao, Minjie Lv, Guiqiang Dong, Nanning Zheng, Tong Zhang:
Exploiting Intracell Bit-Error Characteristics to Improve Min-Sum LDPC Decoding for MLC NAND Flash-Based Storage in Mobile Device. IEEE Trans. Very Large Scale Integr. Syst. 24(8): 2654-2664 (2016)

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