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"Run-Length-Based Test Data Compression Techniques: How Far from Entropy ..."

Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee (2010)

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DOI: 10.1155/2010/670476

access: open

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/vlsi/MehtaDD10
Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee:
Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey. VLSI Design 2010: 670476:1-670476:9 (2010)

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