- Rui Liu
, Zerun Li
, Xiaoyu Zhang
, Wanqian Li, Libo Shen
, Rui Tang, Zhejian Luo, Xiaoming Chen
, Yinhe Han
, Minghua Tang
:
Crypto-DSEDA: A Domain-Specific EDA Flow for CiM-Based Cryptographic Accelerators. IEEE Des. Test 41(5): 46-54 (2024) - Caio Batista de Melo
, Marzieh Ashrafiamiri, Minjun Seo, Fadi J. Kurdahi
, Nikil D. Dutt
:
SAFER: Safety Assurances for Emergent Behavior. IEEE Des. Test 41(4): 17-25 (2024) - Michail Moraitis
, Yanning Ji
, Martin Brisfors
, Elena Dubrova
, Niklas Lindskog, Håkan Englund:
Securing CRYSTALS-Kyber in FPGA Using Duplication and Clock Randomization. IEEE Des. Test 41(5): 7-16 (2024) - Dina A. Moussa
, Michael Hefenbrock
, Mehdi B. Tahoori
:
Testing for Multiple Faults in Deep Neural Networks. IEEE Des. Test 41(3): 47-53 (2024) - Rob Munoz
:
Furthering Moore's Law Integration Benefits in the Chiplet Era. IEEE Des. Test 41(1): 81-90 (2024) - Nicola Nicolici
:
Interview With Janusz Rajski. IEEE Des. Test 41(4): 65-69 (2024) - Nicola Nicolici
:
Interview With Vishwani Agrawal. IEEE Des. Test 41(5): 83-86 (2024) - Yuxuan Pan
, Zhonghua Zhou, S. Arash Sheikholeslam
, André Ivanov
:
VioNet: A Hierarchical Detailed Routing Wire-Short Violation Predictor Based on a Convolutional Neural Network. IEEE Des. Test 41(2): 65-74 (2024) - Partha Pratim Pande
:
Ethics in Computing. IEEE Des. Test 41(1): 4 (2024) - Partha Pratim Pande
:
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security. IEEE Des. Test 41(2): 4 (2024) - Partha Pratim Pande
:
Robust and Secure Systems. IEEE Des. Test 41(3): 4 (2024) - Partha Pratim Pande
:
Silicon Lifecycle Management. IEEE Des. Test 41(4): 4 (2024) - Partha Pratim Pande
:
Postquantum Cryptography for Internet of Things. IEEE Des. Test 41(5): 4 (2024) - Craig Partridge
, Moti Gorin, Eric Easley
, Jesse Gray
:
Five Years Teaching Ethics and Computing. IEEE Des. Test 41(1): 33-39 (2024) - Sudeep Pasricha
, Marilyn Wolf
:
Special Issue on Ethics in Computing. IEEE Des. Test 41(1): 5-6 (2024) - Sudeep Pasricha
, Marilyn Wolf
:
Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence. IEEE Des. Test 41(1): 7-16 (2024) - Stjepan Picek
, Annelie Heuser
, Alan Jovic
, Shivam Bhasin
, Francesco Regazzoni
:
Tipping the Balance: Imbalanced Classes in Deep-Learning Side-Channel Analysis. IEEE Des. Test 41(2): 32-38 (2024) - Andy D. Pimentel
, Valeria Bertacco
, Aida Todri-Sanial
, Theocharis Theocharides:
DATE 2024: Consolidating the New Conference Format. IEEE Des. Test 41(5): 87-94 (2024) - Irith Pomeranz
:
Conventional Tests for Approximate Scan Logic. IEEE Des. Test 41(3): 5-13 (2024) - Mridha Md Mashahedur Rahman
, Shams Tarek
, Kimia Zamiri Azar, Mark M. Tehranipoor, Farimah Farahmandi:
Efficient SoC Security Monitoring: Quality Attributes and Potential Solutions. IEEE Des. Test 41(4): 26-34 (2024) - Janusz Rajski
, Vivek Chickermane, Jean-François Côté
, Stephan Eggersglüß, Nilanjan Mukherjee
, Jerzy Tyszer
:
The Future of Design for Test and Silicon Lifecycle Management. IEEE Des. Test 41(4): 35-49 (2024) - Mahendra Rathor
, Girraj Prasad Rathor
:
Hard-Sign: A Hardware Watermarking Scheme Using Dated Handwritten Signature. IEEE Des. Test 41(2): 75-83 (2024) - Sayed Ahmad Salehi
:
Area-Efficient LFSR-Based Stochastic Number Generators With Minimum Correlation. IEEE Des. Test 41(1): 50-59 (2024) - Anirban Sengupta
, Rahul Chaurasia
:
Secure FFT IP Using C-Way Partitioning-Based Obfuscation and Fingerprint. IEEE Des. Test 41(5): 55-64 (2024) - Fei Su
, Robert Kwasnick, John Holm, William Penner, Hermann Gartler, Josh Boelter, Yufei Zhou, Bijan Arbab, Michael Rothberg:
Product Health Insights Using Telemetry. IEEE Des. Test 41(4): 56-64 (2024) - Mehdi Baradaran Tahoori
, Yervant Zorian:
Special Issue on Silicon Lifecycle Management. IEEE Des. Test 41(4): 5-6 (2024) - Jiewen Yao
, Anas Hlayhel
, Krystian Matusiewicz:
Postquantum KEM Authentication in SPDM for Secure Session Establishment. IEEE Des. Test 41(5): 17-26 (2024) - Kyonghwan Yoon
, Eunjin Jeong
, Woosuk Kang
, Soonhoi Ha
:
Memory Usage Estimation for Dataflow-Model-Based Software Development Methodology. IEEE Des. Test 41(1): 60-69 (2024) - Evangeline F. Y. Young
:
Recap of the 42nd Edition of the International Conference on Computer- Aided Design (ICCAD 2023). IEEE Des. Test 41(2): 88-89 (2024) - Zhang Zhang
, Annan Wang, Hongtao Ren, Guangjun Xie
, Xin Cheng
:
Voltage-Resistance-Adaptive MPPT Circuit for Energy Harvesting. IEEE Des. Test 41(3): 54-62 (2024)