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Publication search results
found 101 matches
- 2015
- Kamel Abouda, Guillaume Aulagnier, Eric Rolland, Marc Cousineau:
Analytical approach to study Electromagnetic emission EME contributors on DC/DC applications. EMC Compo 2015: 77-82 - Ahmed Aldabbagh, Alistair Duffy:
Ageing effects on power RF LDMOS reliability using the Transmission Line Matrix method. EMC Compo 2015: 157-162 - Mohammed Amellall, Sjoerd Op't Land, Richard Perdriau, Mohammed Ramdani, Ali Ahaitouf, M'hamed Drissi:
Direct power injection on functional and non-functional signals of SPI EEPROM memories. EMC Compo 2015: 24-28 - Yann Bacher, Nicolas Froidevaux, Philippe Dupre, Henri Braquet, Gilles Jacquemod:
Resonance analysis for EMC improvement in integrated circuits. EMC Compo 2015: 56-60 - Muhammet Burak Baran, Wim Dehaene, Hugo Pues, Kristof Stijnen:
Case study on the differences between EMI resilience of analog ICs against continuous wave, modulated and transient disturbances. EMC Compo 2015: 207-211 - Raul Blecic, Renaud Gillon, Bart Nauwelaers, Adrijan Baric:
Radiation characteristics of small loop antenna above perforated finite image plane. EMC Compo 2015: 222-227 - Alexandre Boyer, M. Cavarroc:
Enhancement of the spatial resolution of near-field immunity maps. EMC Compo 2015: 163-168 - Mart Coenen, Ming Ye, Huichun Yu:
Dynamic multi-parameter response model for SEED analysis. EMC Compo 2015: 44-49 - Andy Degraeve, Davy Pissoort, Keith Armstrong:
Improving the shielding effectiveness of a board-level shield by bonding it with the waveguide-below-cutoff principle. EMC Compo 2015: 50-55 - Matthieu Deloge, Arnoud P. van der Wel, Shishir Goyal, Gerald Kwakernaat, Adrien Schoof:
A highly-digitized automotive CAN transceiver in 0.14µm high-voltage SOI CMOS. EMC Compo 2015: 13-17 - Bernd Deutschmann, Gunter Winkler, Timuçin Karaca:
Emission reduction in Class D audio amplifiers by optimizing spread spectrum modulation. EMC Compo 2015: 1-6 - Jean-Marc Dienot, Emmanuel Batista, Ioav Ramos:
Thermal-electromagnetic susceptibility behaviors of PWM patterns used in control electronic circuit. EMC Compo 2015: 190-195 - Adrien Doridant, Jérémy Raoult, Sylvie Jarrix, Jean-Jacques Laurin, Patrick Hoffmann:
Preliminary study of Automatic Control Gain loop subjected to pulse-modulated radiofrequency interference. EMC Compo 2015: 109-114 - Priscila Fernandez-Lopez, M. Amara, T. Q. V. Hoang, Frédéric Lafon:
DPI set-up for ICs with differential inputs. EMC Compo 2015: 184-189 - Lars Glaesser, Sven Koenig:
ESD test at component level. EMC Compo 2015: 152-156 - Herbert Hackl, Gunter Winkler, Bernd Deutschmann:
Simulation of radiated emission during the design phase based on scattering parameter measurement. EMC Compo 2015: 228-231 - H. Herrmann, W. Horchler, S. Schwarz, Philipp Schröter, Frank Klotz, Marco Brignone, Franco Fiori:
Smart power IC macromodeling for DPI analysis. EMC Compo 2015: 244-247 - Jongtae Hwang, Youngbong Han, Hyunho Park, Wansoo Nah, Soyoung Kim:
Radiated electromagnetic immunity analysis of VCO using IC stripline method. EMC Compo 2015: 147-151 - Johannes Gert Janschitz:
An EMI robust LIN driver with low electromagnetic emission. EMC Compo 2015: 83-86 - Sergei Kapora, Marcel Hanssen, Jan Niehof, Quino Sandifort:
Methodology for interference analysis during early design stages of high-performance mixed-signal ICs. EMC Compo 2015: 67-71 - Manuel Kaufmann, Timm Ostermann:
Simulation model based on JEDEC JS-001-2014 for circuit simulation of HBM ESD pulses on IC level. EMC Compo 2015: 202-206 - Jonghoon J. Kim, Daniel H. Jung, Heegon Kim, Sunkyu Kong, Sumin Choi, Jaemin Lim, Joungho Kim:
TSV-based current probing structure using magnetic coupling in 2.5D and 3D IC. EMC Compo 2015: 212-215 - Andrea Lavarda, Dominik Amschl, Susanne Bauer, Bernd Deutschmann:
Characterization of the immunity of integrated circuits (ICs) at wafer level. EMC Compo 2015: 196-201 - Andrea Lavarda, Bernd Deutschmann:
EMI improved chopped operational amplifier. EMC Compo 2015: 72-76 - Jaemin Lim, Manho Lee, Daniel H. Jung, Jonghoon J. Kim, Sumin Choi, Hyunsuk Lee, Joungho Kim:
Shielding structures for through silicon via (TSV) to active circuit noise coupling in 3D IC. EMC Compo 2015: 248-251 - Marko Magerl, Christian Stockreiter, Oliver Eisenberger, Rainer Minixhofer, Adrijan Baric:
Building interchangeable black-box models of integrated circuits for EMC simulations. EMC Compo 2015: 258-263 - Tvrtko Mandic, Raul Blecic, Renaud Gillon, Adrijan Baric:
DC/DC converter dead-time variation analysis and far-field radiation estimation. EMC Compo 2015: 7-12 - Sergey Miropolsky, Stefan Jahn, Frank Klotz, Stephan Frei:
Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz. EMC Compo 2015: 137-142 - Hidetoshi Miyahara, Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada:
Relation between internal terminal voltage and immunity behavior of LDO regulator circuits. EMC Compo 2015: 143-146 - Christofer de Oliveira, Leticia Bolzani Poehls, Fabian Vargas:
On-chip Watchdog to monitor RTOS activity in MPSoC exposed to noisy environment. EMC Compo 2015: 61-66
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