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ORCIDKatherine Shu-Min Li
- > Home > Persons > Katherine Shu-Min Li
Publications
- 2021
[c61]Katherine Shu-Min Li, Leon Li-Yang Chen, Ken Chau-Cheung Cheng
, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Nova Cheng-Yen Tsai, Leon Chou, Gus Chang-Hung Han, Jwu E. Chen, Hsing-Chung Liang, Chun-Lung Hsu:
Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering. ETS 2021: 1-2- [c60]Leon Li-Yang Chen, Katherine Shu-Min Li, Xu-Hao Jiang, Sying-Jyan Wang, Andrew Yi-Ann Huang, Jwu E. Chen, Hsing-Chung Liang, Chun-Lung Hsu:
Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling. ITC 2021: 208-212 - 2020
- [c56]Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Andrew Yi-Ann Huang, Ji-Wei Li, Leon Li-Yang Chen, Nova Cheng-Yen Tsai, Sying-Jyan Wang, Chen-Shiun Lee, Leon Chou, Peter Yi-Yu Liao, Hsing-Chung Liang, Jwu E. Chen:
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. DATE 2020: 1710-1711 - [c51]Dyi-Chung Hu, Hirohito Hashimoto, Li-Fong Tseng, Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang, Sean Y.-S. Chen, Jwu E. Chen, Clark Liu, Andrew Yi-Ann Huang:
Innovative Practice on Wafer Test Innovations. VTS 2020: 1 - 2009
- [j5]Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
A Unified Detection Scheme for Crosstalk Effects in Interconnection Bus. IEEE Trans. Very Large Scale Integr. Syst. 17(2): 306-311 (2009) - 2007
- [j3]Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection. J. Electron. Test. 23(4): 341-355 (2007) - [j2]Katherine Shu-Min Li, Yao-Wen Chang, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
Multilevel Full-Chip Routing With Testability and Yield Enhancement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(9): 1625-1636 (2007) - 2006
- [j1]Katherine Shu-Min Li, Chauchin Su, Yao-Wen Chang, Chung-Len Lee, Jwu E. Chen:
IEEE Standard 1500 Compatible Interconnect Diagnosis for Delay and Crosstalk Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(11): 2513-2525 (2006) - [c7]Katherine Shu-Min Li, Yao-Wen Chang, Chauchin Su, Chung-Len Lee, Jwu E. Chen:
IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. ASP-DAC 2006: 366-371 - 2005
- [c5]Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
Oscillation ring based interconnect test scheme for SOC. ASP-DAC 2005: 184-187 - [c4]Katherine Shu-Min Li, Chung-Len Lee, Tagin Jiang, Chauchin Su, Jwu E. Chen:
Finite State Machine Synthesis for At-Speed Oscillation Testability. Asian Test Symposium 2005: 360-365 - [c3]Katherine Shu-Min Li, Chung-Len Lee, Yao-Wen Chang, Chauchin Su, Jwu E. Chen:
Multilevel full-chip routing with testability and yield enhancement. SLIP 2005: 29-36 - 2004
- [c2]Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
A Unified Approach to Detecting Crosstalk Faults of Interconnects in Deep Sub-Micron VLSI. Asian Test Symposium 2004: 145-150
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