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ORCIDJie Li 0030
Person information
- affiliation: Harbin Institute of Technology, Microelectronics Center, China
Other persons with the same name
- Jie Li — disambiguation page
- Jie Li 0001
![[0000-0001-7950-4233]](https://dblp.dagstuhl.de/img/orcid-mark.12x12.png "0000-0001-7950-4233")
— Xidian University, School of Electronic Engineering, Xi'an, China - Jie Li 0002 — Zhengzhou University, School of Cyber Science and Engineering, China (and 2 more)
- Jie Li 0003 — University of Virginia, Charlottesville, VA, USA
- Jie Li 0004 — Stevens Institute of Technology, Hoboken, NJ, USA
- Jie Li 0005 — City University of New York, NY, USA
- Jie Li 0006 — Tianjin University, School of Computer Software, China
- Jie Li 0007 — University of Melbourne, Centre for Energy Efficient Telecommunication, VIC, Australia (and 1 more)
- Jie Li 0008 — Northeastern University, College of Computer Science and Engineering, Shenyang, China
- Jie Li 0009 — East China Jiaotong University, School of Electrical and Automation Engineering, Nanchang, China
- Jie Li 0010 — Michigan State University, East Lansing, MI, USA
- Jie Li 0011 — National University of Defense Technology, College of Mechatronics Engineering and Automation, Changsha, China
- Jie Li 0012 — Peking University, Key Laboratory of Machine Perception (MOE) / Department of Machine Intelligence, Beijing, China
- Jie Li 0013 — Clarkson University, ECE Department, Potsdam, NY, USA (and 1 more)
- Jie Li 0014 — Drexel University, Department of Computer Science, Philadelphia, PA, USA
- Jie Li 0015 — Hefei University of Technology, School of Computer and Information, China (and 1 more)
- Jie Li 0016 — Tongji University, Department of Computer Science, Laboratory of Cognition and Intelligent Computing, Shanghai, China
- Jie Li 0017 — University of Michigan, Department of Electrical Engineering and Computer Science, Ann Arbor, MI, USA
- Jie Li 0018 — Hangzhou Dianzi University, Information Engineering School, China
- Jie Li 0019 — Huawei Technologies, Hong Kong (and 3 more)
- Jie Li 0020 — North China University of Science and Technology, Key Laboratory of Engineering Computing / MOE Key Laboratory with Modern Metallurgical Technology, Tangshan, China
- Jie Li 0021 — Teesside University, School of Computing, Engineering and Digital Technologies, Middlesbrough, UK (and 1 more)
- Jie Li 0022 — Wuhan University, School of Geodesy and Geomatics, LIEMARS, China
- Jie Li 0023 — Yunnan University, School of Information Science and Engineering, Kunming, China
- Jie Li 0024 — University of Rhode Island, Department of Electrical, Computer, and Biomedical Engineering, Kingston, RI, USA (and 2 more)
- Jie Li 0025 — North University of China, School of Materials Science and Engineering, Taiyuan, China
- Jie Li 0026 — Hokkaido University, Nexus Group, Sapporo, Japan
- Jie Li 0027 — Xidian University, Key Laboratory of Radar Signal Processing, Xi'an, China
- Jie Li 0028 — Chongqing University, China (and 1 more)
- Jie Li 0029 — Dalian University of Technology, School of Software, China (and 1 more)
- Jie Li 0031 — Toyota Research Institute (TRI)
- Jie Li 0032 — Kwai, Beijing, China (and 1 more)
- Jie Li 0033 — Capital University of Economics and Business, School of Safety and Environmental Engineering, Beijing, China (and 1 more)
- Jie Li 0034 — Missouri University of Science and Technology, Mechanical and Aerospace Engineering Department, Rolla, MO, USA
- Jie Li 0035 — Chinese Academy of Sciences, Shanghai Institutes for Biological Sciences, CAS Key Laboratory of Computational Biology, China
- Jie Li 0036 — North University of China, Key Laboratory of Instrumentation Science & Dynamic Measurement / China National Key Laboratory for Electronic Measurement Technology, Taiyuan, China (and 1 more)
- Jie Li 0037 — Xi'an Jiaotong University, School of Electrical Engineering, China
- Jie Li 0038 — Huazhong University of Science and Technology, School of Hydropower and Information Engineering / Hubei Key Laboratory of Digital Valley Science and Technology, Wuhan, China
- Jie Li 0039 — South China University of Technology, School of Electronic and Information Engineering, Guangzhou, China
- Jie Li 0040 — Nanjing University of Science and Technology, School of Computer Science and Engineering, China
- Jie Li 0041 — National University of Defense Technology, School of Computer, Changsha, China
- Jie Li 0042 — Tsinghua University, School of Vehicle and Mobility, State Key Laboratory of Automotive Safety and Energy, Beijing, China
- Jie Li 0043 — Nanyang Technological University, School of Computer Science and Engineering, Singapore
- Jie Li 0044 — Chang'an University, School of Electronic and Control Engineering, Xi'an, China (and 1 more)
- Jie Li 0045 — Zhejiang Sci-Tech University, School of Information Science and Technology, Hangzhou, China
- Jie Li 0046 — Xi'an Jiaotong University, State Key Laboratory for manufacturing Systems Engineering, China
- Jie Li 0047 — South China University of Technology, College of Electric Power, Guangzhou, China
- Jie Li 0048 — Nanjing University of Aeronautics and Astronautics, College of Civil Aviation, National Key Laboratory of Air Traffic Flow Management, China
- Jie Li 0049 — Tongji University, College of Electronics and Information Engineering, Shanghai, China
- Jie Li 0050 — Army Engineering University of PLA, National Key Laboratory on Electromagnetic Environment Effects and Electro-Optical Engineering, Nanjing, China
- Jie Li 0051 — Beijing Wuzi University, School of Information, China
- Jie Li 0052 — Xiamen University, School of Informatics, Department of Artificial Intelligence, China
- Jie Li 0053 — Huazhong University of Science and Technology, School of Artificial Intelligence and Automation, Wuhan, China
- Jie Li 0054 — Yunnan University, School of Information Science and Engineering, China
- Jie Li 0055 — Harbin Institute of Technology, School of Computer Science and Technology, China
- Jie Li 0056 — Guodian Technology and Environment Group Corporation Ltd., Beijing, China
- Jie Li 0057 — Texas Tech University, Department of Computer Science, Lubbock, TX, USA
- Jie Li 0058 — Central South University of Forestry and Technology, Changsha, China (and 1 more)
- Jie Li 0059 — North China University of Science and Technology, School of Metallurgy and Energy, Tangshan, China
- Jie Li 0060 — First Institute of Oceanography, Ministry of Natural Resources, Qingdao, China
- Jie Li 0061 — Hebei University of Technology, School of Economics and Management, Tianjin, China
- Jie Li 0062 — Nanjing University of Information Science and Technology, KLME / ILCEC / CIC-FEMD, China
- Jie Li 0063 — University of Electronic Science and Technology of China, School of Information and Communication Engineering, Chengdu, China (and 1 more)
- Jie Li 0064 — EPAM Systems, Hoofddrop, Netherlands (and 1 more)
- Jie Li 0065 — Chinese Academy of Sciences, Key Laboratory of Technology in Geo-spatial Information Processing and Application System, China (and 1 more)
- Jie Li 0066 — Zhengzhou University, School of International Studies, Zhengzhou, Henan, China
- Jie Li 0067 — South China Normal University, School of Software, Foshan, Guangdong, China (and 1 more)
- Jie Li 0068 — Donghua University, College of Mechanical Engineering, Shanghai, China
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Journal Articles
- 2024
[j10]He Liu, Jiaqiang Li, Liyi Xiao, Tianqi Wang, Jie Li:
SET-detection low complexity burst error correction codes for SRAM protection. Integr. 98: 102212 (2024)- 2022
- [j9]Jie Li, Liyi Xiao, Linzhe Li, Hongchen Li, He Liu, Chenxu Wang:
A Write-Buffer Scheme to Protect Cache Memories Against Multiple-Bit Errors. IEEE Access 10: 89000-89010 (2022) - [j8]Jie Li, Liyi Xiao, Linzhe Li, Hongchen Li, He Liu, Chenxu Wang:
A Low-Cost Error-Tolerant Flip-Flop Against SET and SEU for Dependable Designs. IEEE Trans. Circuits Syst. I Regul. Pap. 69(7): 2721-2729 (2022) - 2021
- [j7]Jie Li, Pedro Reviriego, Shanshan Liu, Liyi Xiao, Fabrizio Lombardi:
Designs for efficient low power cardinality and similarity sketches by Two-Step Hashing (TSH). Integr. 81: 246-253 (2021) - [j6]Hongchen Li, Liyi Xiao, Chunhua Qi, Jie Li:
Design of High-Reliability Memory Cell to Mitigate Single Event Multiple Node Upsets. IEEE Trans. Circuits Syst. I Regul. Pap. 68(10): 4170-4181 (2021) - 2020
- [j5]Jie Li, Shanshan Liu, Pedro Reviriego, Liyi Xiao, Fabrizio Lombardi:
Scheme for periodical concurrent fault detection in parallel CRC circuits. IET Comput. Digit. Tech. 14(2): 80-85 (2020) - [j4]Rongsheng Zhang, Liyi Xiao, Jie Li, Xuebing Cao, Linzhe Li:
An Adjustable and Fast Error Repair Scrubbing Method Based on Xilinx Essential Bits Technology for SRAM-Based FPGA. IEEE Trans. Reliab. 69(2): 430-439 (2020) - 2019
- [j3]Xuebing Cao, Liyi Xiao, Jie Li, Rongsheng Zhang, Shanshan Liu, Jinxiang Wang:
A Layout-Based Soft Error Vulnerability Estimation Approach for Combinational Circuits Considering Single Event Multiple Transients (SEMTs). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(6): 1109-1122 (2019) - 2018
- [j2]Rongsheng Zhang, Liyi Xiao, Jie Li, Xuebing Cao, Chunhua Qi, Jiaqiang Li, Mingjiang Wang:
A fast fault injection platform of multiple SEUs for SRAM-based FPGAs. Microelectron. Reliab. 82: 147-152 (2018) - [j1]Jiaqiang Li, Pedro Reviriego, Liyi Xiao, Costas Argyrides, Jie Li:
Extending 3-bit Burst Error-Correction Codes With Quadruple Adjacent Error Correction. IEEE Trans. Very Large Scale Integr. Syst. 26(2): 221-229 (2018)
Conference and Workshop Papers
- 2019
- [c9]Hongchen Li, Liyi Xiao, Jie Li, He Liu:
Novel High-Performance and Cost Effective Soft Error Hardened Flip-Flop Design for Nanoscale CMOS Technology. ASICON 2019: 1-4 - [c8]Linzhe Li, Liyi Xiao, Jie Li, He Liu, Zhigang Mao:
Synergistic Effect of BTI and Process Variations on Impact and Monitoring of Combination Circuit. ASICON 2019: 1-4 - [c7]Jie Li, Liyi Xiao, Hongchen Li, Lulu Liao, Chenxu Wang:
A Radiation Hardened Clock Inverter Cell with High Reliability for Mitigating SET in Clock Network. ASICON 2019: 1-4 - [c6]Xuebing Cao, Liyi Xiao, Linzhe Li, Jie Li, Tianqi Wang:
Simulation of Proton Induced Single Event Upsets in Bulk Nano-CMOS SRAMs. ICICDT 2019: 1-4 - 2018
- [c5]Xuebing Cao, Liyi Xiao, Linzhe Li, Jie Li, Jiaqiang Li, Jinxiang Wang:
Soft error optimization of combinational circuit based on gate sizing and multi-objective particle swarm optimization algorithm. IOLTS 2018: 165-170 - 2017
- [c4]Rongsheng Zhang, Liyi Xiao, Jie Li:
A fast and accurate fault injection platform for SRAM-based FPGAs. ASICON 2017: 359-362 - [c3]Liyi Xiao, Anlong Li, Xuebing Cao, Hongchen Li, Rongsheng Zhang, Jie Li, Tianqi Wang:
A method to estimate cross-section of circuits at RTL levels. ASICON 2017: 363-366 - [c2]Shanshan Liu, Liyi Xiao, Jie Li, Yihan Zhou, Zhigang Mao:
Low redundancy matrix-based codes for adjacent error correction with parity sharing. ISQED 2017: 76-80 - 2015
- [c1]Liyi Xiao, Jiaqiang Li, Jie Li, Jing Guo:
Hardened design based on advanced orthogonal Latin code against two adjacent multiple bit upsets (MBUs) in memories. ISQED 2015: 485-489
Coauthor Index
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last updated on 2024-10-31 20:16 CET by the dblp team
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