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David Abercrombie
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2010 – 2019
- 2010
- [c11]John Ferguson, Sandeep Koranne, David Abercrombie:
An innovative method to automate the waiver of IP-level DRC violations. ISQED 2010: 493-498
2000 – 2009
- 2009
- [c10]David Abercrombie, Fedor Pikus, Cosmin Cazan:
Use of lithography simulation for the calibration of equation-based design rule checks. DAC 2009: 67-70 - 2008
- [c9]Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann:
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC 2008: 1-9 - 2006
- [c8]Karen Chow, David Abercrombie, Mark Basel:
Method for Managing Electromigration in SOC'S When Designing for Both Reliability and Manufacturing. SoCC 2006: 95-102 - [c7]David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman:
DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. VLSI Design 2006: 14 - 2005
- [j1]Jay Jahangiri, David Abercrombie:
Value-Added Defect Testing Techniques. IEEE Des. Test Comput. 22(3): 224-231 (2005) - [c6]Jay Jahangiri, David Abercrombie:
Meeting Nanometer DPM Requirements Through DFT. ISQED 2005: 276-282 - 2004
- [c5]Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw:
ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. ITC 2004: 181-189 - 2003
- [c4]Thaddeus T. Shannon, David Abercrombie, James McNames:
Process monitoring via independent components. SMC 2003: 3496-3500 - [c3]James McNames, David Abercrombie, David Turner, Thaddeus T. Shannon:
Semiconductor manufacturing process visualization. SMC 2003: 4940-4944 - 2002
- [c2]David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge:
Isolating and Removing Sources of Variation in Test Data. ITC 2002: 464-471
1990 – 1999
- 1997
- [c1]David Abercrombie, Guy G. Gable:
Industry-Government Collaboration: Queensland 's IT&T Strategy and the Information Industries Board. PACIS 1997: 63
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