![](https://dblp.dagstuhl.de/img/logo.ua.320x120.png)
![](https://dblp.dagstuhl.de/img/dropdown.dark.16x16.png)
![](https://dblp.dagstuhl.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.dagstuhl.de/img/search.dark.16x16.png)
![search dblp](https://dblp.dagstuhl.de/img/search.dark.16x16.png)
default search action
Ahmad A. Al-Yamani
Person information
Refine list
![note](https://dblp.dagstuhl.de/img/note-mark.dark.12x12.png)
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2010
- [j9]Ahmad A. Al-Yamani, Edward J. McCluskey:
Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test Patterns. J. Electron. Test. 26(5): 513-521 (2010)
2000 – 2009
- 2009
- [j8]Aiman H. El-Maleh
, Mustafa Imran Ali, Ahmad A. Al-Yamani:
Reconfigurable broadcast scan compression using relaxation-based test vector decomposition. IET Comput. Digit. Tech. 3(2): 143-161 (2009) - [c20]Costas Argyrides, Ahmad A. Al-Yamani, Carlos Arthur Lang Lisbôa, Luigi Carro
, Dhiraj K. Pradhan:
Increasing memory yield in future technologies through innovative design. ISQED 2009: 622-626 - 2008
- [j7]Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda:
Comparative study of centralised and distributed compatibility-based test data compression. IET Comput. Digit. Tech. 2(2): 108-117 (2008) - 2007
- [j6]Ahmad A. Al-Yamani:
Energy-delay efficient test. IET Comput. Digit. Tech. 1(5): 653-658 (2007) - [j5]Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda:
Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(5): 907-918 (2007) - [j4]Ahmad A. Al-Yamani, S. Ramsundar, Dhiraj K. Pradhan:
A Defect Tolerance Scheme for Nanotechnology Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(11): 2402-2409 (2007) - [c19]Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda:
Systematic Scan Reconfiguration. ASP-DAC 2007: 738-743 - [c18]Aiman H. El-Maleh, Mustafa Imran Ali, Ahmad A. Al-Yamani:
A Reconfigurable Broadcast Scan Compression Scheme Using Relaxation Based Test Vector Decompos. ATS 2007: 91-94 - [c17]S. Ramsundar, Ahmad A. Al-Yamani, Dhiraj K. Pradhan:
Defect Tolerance in Nanotechnology Switches Using a Greedy Reconfiguration Algorithm. ISQED 2007: 807-813 - [c16]Costas Argyrides, Ahmad A. Al-Yamani, Dhiraj K. Pradhan:
High defect tolerant low cost memory chips. SoCC 2007: 119-122 - 2006
- [c15]Ahmad A. Al-Yamani:
DFT for controlled-impedance I/O buffers. DAC 2006: 405-410 - 2005
- [j3]Ahmad A. Al-Yamani, Subhasish Mitra
, Edward J. McCluskey:
Optimized reseeding by seed ordering and encoding. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(2): 264-270 (2005) - [j2]Ahmad A. Al-Yamani, Edward J. McCluskey:
Test chip experimental results on high-level structural test. ACM Trans. Design Autom. Electr. Syst. 10(4): 690-701 (2005) - [c14]Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda:
Should Illinois-Scan Based Architectures be Centralized or Distributed? DFT 2005: 406-414 - [c13]Ahmad A. Al-Yamani, Edward J. McCluskey:
BIST-Guided ATPG. ISQED 2005: 244-249 - [c12]Intaik Park, Ahmad A. Al-Yamani, Edward J. McCluskey:
Effective TARO Pattern Generation. VTS 2005: 161-166 - [c11]Ahmad A. Al-Yamani, Erik Chmelar, Mikhail Grinchuck:
Segmented Addressable Scan Architecture. VTS 2005: 405-411 - 2004
- [c10]Ahmad A. Al-Yamani, Edward J. McCluskey:
Test quality for high level structural test. HLDVT 2004: 109-114 - [c9]Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra:
ELF-Murphy Data on Defects and Test Sets. VTS 2004: 16-22 - 2003
- [c8]Ahmad A. Al-Yamani, Edward J. McCluskey:
Seed encoding with LFSRs and cellular automata. DAC 2003: 560-565 - [c7]Ahmad A. Al-Yamani, Sadiq M. Sait, Hassan R. Barada
, Habib Youssef:
Parallel Tabu Search in a Heterogeneous Environment. IPDPS 2003: 56 - [c6]Ahmad A. Al-Yamani, Edward J. McCluskey:
Built-In Reseeding for Serial Bist. VTS 2003: 63-68 - [c5]Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey:
Bist Reseeding with very few Seeds. VTS 2003: 69-76 - 2002
- [j1]Ahmad A. Al-Yamani, Sadiq M. Sait
, Habib Youssef, Hassan R. Barada
:
Parallelizing Tabu Search on a Cluster of Heterogeneous Workstations. J. Heuristics 8(3): 277-304 (2002) - [c4]Ahmad A. Al-Yamani, Sadiq M. Sait
, Hassan R. Barada
:
HPTS: heterogeneous parallel tabu search for VLSI placement. IEEE Congress on Evolutionary Computation 2002: 351-355 - [c3]Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey:
Testing Digital Circuits with Constraints. DFT 2002: 195-206 - 2001
- [c2]Ahmad A. Al-Yamani, Nahmsuk Oh, Edward J. McCluskey:
Performance Evaluation of Checksum-Based ABFT. DFT 2001: 461- - 2000
- [c1]Sadiq M. Sait, Habib Youssef, Hassan R. Barada, Ahmad A. Al-Yamani:
A parallel tabu search algorithm for VLSI standard-cell placement. ISCAS 2000: 581-584
Coauthor Index
![](https://dblp.dagstuhl.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-25 05:57 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint