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ORCIDVTS 2004: Napa Valley, CA, USA
- 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. IEEE Computer Society 2004, ISBN 0-7695-2134-7
Defect-Oriented Testing
- Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer:
Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets. 9-15 - Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra:
ELF-Murphy Data on Defects and Test Sets. 16-22 - Srikanth Venkataraman, Srihari Sivaraj, M. Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo
:
An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. 23-30
Delay Testing
- Manish Sharma, Janak H. Patel:
What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit? 31-36 - Wangqi Qiu, Xiang Lu, Jing Wang, Zhuo Li, D. M. H. Walker, Weiping Shi:
A Statistical Fault Coverage Metric for Realistic Path Delay Faults. 37-42 - Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger:
Delay Defect Screening using Process Monitor Structures. 43-52
Current Based Testing
- Josep Rius Vázquez, José Pineda de Gyvez:
Built-in Current Sensor for ?I{DDQ} Testing of Deep Submicron Digital CMOS ICs. 53-58 - Claude Thibeault:
On New Current Signatures and Adaptive Test Technique Combination. 59-64 - Sagar S. Sabade, D. M. H. Walker:
On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set. 65-72
Test Data Compression and Low-Speed ATE
- Nodari Sitchinava, Samitha Samaranayake, Rohit Kapur, Emil Gizdarski, Frederic Neuveux, Thomas W. Williams:
Changing the Scan Enable during Shift. 73-78 - C. V. Krishna, Nur A. Touba:
3-Stage Variable Length Continuous-Flow Scan Vector Decompression Scheme. 79-86 - Michael R. Nelms, Kevin W. Gorman, Darren Anand:
Generating At-Speed Array Fail Maps with Low-Speed ATE. 87-96
Pattern Debug, Yield Analysis and FPGA Testing
- Debashis Nayak, Srikanth Venkataraman, Paul J. Thadikaran:
Razor: A Tool for Post-Silicon Scan ATPG Pattern Debug and Its Application. 97-102 - Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre:
Yield Analysis of Logic Circuits. 103-108 - Erik Chmelar, Shahin Toutounchi:
FPGA Bridging Fault Detection and Location via Differential I{DDQ}. 109-116
Memory Testing I
- Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor:
Effects of Bit Line Coupling on the Faulty Behavior of DRAMs. 117-122 - Mohamed Azimane, Ananta K. Majhi:
New Test Methodology for Resistive Open Defect Detection in Memory Address Decoders. 123-128 - Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri:
March iC-: An Improved Version of March C- for ADOFs Detection. 129-138
MEMs Testing and FPGA Testing
- Nilmoni Deb, R. D. (Shawn) Blanton:
Multi-Modal Built-In Self-Test for Symmetric Microsystems. 139-147 - Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone:
A Dual-Mode Built-In Self-Test Technique for Capacitive MEMS Devices. 148-153 - Mehdi Baradaran Tahoori, Edward J. McCluskey, Michel Renovell, Philippe Faure:
A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs. 154-170
Low-Voltage and Thermal Testing
- Piet Engelke, Ilia Polian, Michel Renovell, Bharath Seshadri, Bernd Becker:
The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults. 171-178 - Josep Altet, Antonio Rubio, M. Amine Salhi, Jose Luis Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov:
Sensing temperature in CMOS circuits for Thermal Testing. 179-184 - Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware:
Detection of Temperature Sensitive Defects Using ZTC. 185-192
Logic Built-In Self-Test
- Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
Planar High Performance Ring Generators. 193-198 - Liyang Lai, Thomas Rinderknecht, Wu-Tung Cheng, Janak H. Patel:
Logic BIST Using Constrained Scan Cells. 199-205 - Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras:
BIST Technique by Equally Spaced Test Vector Sequences. 206-216
Analog Testing I
- Sule Ozev, Christian Olgaard:
Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures. 217-222 - Qi Wang, Yi Tang, Mani Soma:
GHz RF Front-end Bandwidth Time Domain Measurement. 223-228 - Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee:
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. 229-236
Memory Testing II
- Baosheng Wang, Josh Yang, James Cicalo, André Ivanov, Yervant Zorian:
Reducing Embedded SRAM Test Time under Redundancy Constraints. 237-242 - Xiaogang Du, Sudhakar M. Reddy, Don E. Ross, Wu-Tung Cheng, Joseph Rayhawk:
Memory BIST Using ESP. 243-248 - Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A Methodology for Design and Evaluation of Redundancy Allocation Algorithms. 249-260
Analog Testing II
- Alberto Valdes-Garcia, José Silva-Martínez, Edgar Sánchez-Sinencio:
An On-Chip Transfer Function Characterization System for Analog Built-in Testing. 261-266 - Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang:
A Scalable On-Chip Jitter Extraction Technique. 267-272 - Selim Sermet Akbay, Abhijit Chatterjee:
Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference. 273-290
Defect Analysis and Fault Simulation
- Mehdi Baradaran Tahoori, Mariam Momenzadeh, Jing Huang, Fabrizio Lombardi:
Defects and Faults in Quantum Cellular Automata at Nano Scale. 291-296 - Sounil Biswas, Kumar N. Dwarakanath, R. D. (Shawn) Blanton:
Generalized Sensitization using Fault Tuples. 297-303 - Abhishek Singh, Chintan Patel, Jim Plusquellic:
Fault Simulation Model for i{DDT} Testing: An Investigation. 304-312
Issues in Reliability
- Michael Nicolaidis, Nadir Achouri, Lorena Anghel:
A Diversified Memory Built-In Self-Repair Approach for Nanotechnologies. 313-318 - Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris:
Cost-Driven Selection of Parity Trees. 319-324 - Balkaran S. Gill, Christos A. Papachristou, Francis G. Wolff:
Soft Delay Error Effects in CMOS Combinational Circuits. 325-334
Wireless and System Testing
- Hans Eberle, Arvinderpal Wander, Nils Gura:
Testing Systems Wirelessly. 335-340 - Brian Moore, Christopher J. Backhouse, Martin Margala:
Design of Wireless Sub-Micron Characterization System. 341-346 - Tian-Wei Huang, Pei-Si Wu, Ren-Chieh Liu, Jeng-Han Tsai, Huei Wang, Tzi-Dar Chiueh:
Boundary Scan for 5-GHz RF Pins Using LC Isolation Networks. 347-354
System-on-Chip Testing
- Gang Zeng, Hideo Ito:
Hybrid BIST for System-on-a-Chip Using an Embedded FPGA Core. 355-360 - Erik Larsson, Julien Pouget, Zebo Peng:
Defect-Aware SOC Test Scheduling. 361-366 - Md. Saffat Quasem, Sandeep K. Gupta:
Designing Reconfigurable Multiple Scan Chains for Systems-on-Chip. 367-376
Analog Testing and Design Validation
- Ashwin Raghunathan, Hongjoong Shin, Jacob A. Abraham, Abhijit Chatterjee:
Prediction of Analog Performance Parameters Using Oscillation Based Test. 377-382 - Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell:
An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. 383-388 - Qingwei Wu, Michael S. Hsiao:
Efficient ATPG for Design Validation Based On Partitioned State Exploration Histories. 389-405
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