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Rainer Dorsch
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Journal Articles
- 2017
- [j4]Sebastian Stieber, Rainer Dorsch, Christian Haubelt:
Accurate Sample Time Reconstruction of Inertial FIFO Data. Sensors 17(12): 2894 (2017) - 2012
- [j3]Rainer Dorsch, Richard K. Errickson, Markus M. Helms, G. Crew, Thomas A. Gregg, Welela Haileselassie, L. W. Helmer, Andreas Kohler, Kulwant M. Pandey, Susanne Roscher, E. S. Rotter, Christian Haubelt:
IBM Parallel Sysplex design for the IBM z196 system. IBM J. Res. Dev. 56(1): 9 (2012) - 2009
- [j2]Thomas Schlipf, Markus M. Helms, Jürgen Ruf, M. Klein, Rainer Dorsch, B. Hoppe, Walter Lipponer, S. Boekholt, T. Rower, Manfred H. Walz, S. Junghans:
Design and verification of the IBM System z10 I/O subsystem chips. IBM J. Res. Dev. 53(1): 7 (2009) - 2002
- [j1]Rainer Dorsch, Hans-Joachim Wunderlich:
Reusing Scan Chains for Test Pattern Decompression. J. Electron. Test. 18(2): 231-240 (2002)
Conference and Workshop Papers
- 2024
- [c23]Alexandra Küster, Rainer Dorsch, Christian Haubelt:
Adaptive ODE Solvers for Timed Data Flow Models in SystemC-AMS. DATE 2024: 1-6 - 2023
- [c22]Alexandra Küster, Rainer Dorsch, Christian Haubelt:
Structural Generation of Virtual Prototypes for Smart Sensor Development in SystemC-AMS from Simulink Models. DATE 2023: 1-2 - 2022
- [c21]Alexandra Küster, Rainer Dorsch, Christian Haubelt, Karsten Einwich:
Virtual Prototyping in SystemC AMS for Validation of Tight Sensor/Firmware Interaction in Smart Sensors. FDL 2022: 1-8 - 2019
- [c20]Jens Rudolf, Daniel Gis, Sebastian Stieber, Christian Haubelt, Rainer Dorsch:
SystemC Power Profiling for IoT Device Firmware using Runtime Configurable Models. MECO 2019: 1-6 - 2018
- [c19]Florian Grützmacher, Albert Hein, Benjamin Beichler, Polichronis Lepidis, Rainer Dorsch, Thomas Kirste, Christian Haubelt:
Energy Efficient On-Sensor Processing for Online Activity Recognition. PECCS 2018: 223-230 - 2017
- [c18]Florian Grützmacher, Johann-Peter Wolff, Albert Hein, Polichronis Lepidis, Rainer Dorsch, Thomas Kirste, Christian Haubelt:
Towards energy efficient sensor nodes for online activity recognition. IECON 2017: 8291-8296 - 2016
- [c17]Sebastian Stieber, Rainer Dorsch, Christian Haubelt:
Accurate Sample Time Reconstruction for Sensor Data Synchronization. ARCS 2016: 185-196 - [c16]Johann-Peter Wolff, Sebastian Stieber, Tobias Rankl, Rainer Dorsch:
Improving Always-On Gesture Recognition Power Efficiency for Android Devices Using Sensor Hubs. CSE/EUC/DCABES 2016: 64-67 - [c15]Nils Büscher, Lars Middendorf, Christian Haubelt, Rainer Dorsch, Frederik Wegelin:
Statistical analysis and improvement of the repeatability and reproducibility of an evaluation method for IMUs on a smartphone. EICS 2016: 149-158 - 2015
- [c14]Lars Middendorf, Rainer Dorsch, Rudolf Bichler, Christina Strohrmann, Christian Haubelt:
A Mobile Camera-Based Evaluation Method of Inertial Measurement Units on Smartphones. IoT 360 (2) 2015: 362-372 - 2014
- [c13]Sebastian Stieber, Johann-Peter Wolff, Christian Haubelt, Rainer Dorsch:
Hybride Prototypisierung eines Sensorsubsystems. MBMV 2014: 209-212 - 2012
- [c12]Anton Tsepurov, Gunter Bartsch, Rainer Dorsch, Maksim Jenihhin, Jaan Raik, Valentin Tihhomirov:
A scalable model based RTL framework zamiaCAD for static analysis. VLSI-SoC 2012: 171-176 - 2010
- [c11]Christian Zebelein, Joachim Falk, Christian Haubelt, Jürgen Teich, Rainer Dorsch:
Efficient High-Level modeling in the networking domain. DATE 2010: 1189-1194 - [c10]Joachim Falk, Christian Zebelein, Christian Haubelt, Jürgen Teich, Rainer Dorsch:
Integrating Hardware/Firmware Verification Efforts Using SystemC High-Level Models. MBMV 2010: 137-146 - 2007
- [c9]Rainer Dorsch, Jürgen Ruf:
Transaction Modeling and RTL Simulation Analysis. MBMV 2007: 1-8 - 2006
- [c8]Martin Streubühr, Joachim Falk, Christian Haubelt, Jürgen Teich, Rainer Dorsch, Thomas Schlipf:
Task-accurate performance modeling in SystemC for real-time multi-processor architectures. DATE 2006: 480-481 - 2005
- [c7]Pattara Kiatisevi, Luis Leonardo Azuara-Gomez, Rainer Dorsch, Hans-Joachim Wunderlich:
Development of an audio player as system-on-a-chip using an open source platform. ISCAS (3) 2005: 2935-2938 - 2002
- [c6]Lars Schäfer, Rainer Dorsch, Hans-Joachim Wunderlich:
RESPIN++ - deterministic embedded test. ETW 2002: 37-44 - [c5]Rainer Dorsch, Ramón Huerta Rivera, Hans-Joachim Wunderlich, Martin Fischer:
Adapting an SoC to ATE Concurrent Test Capabilities. ITC 2002: 1169-1175 - 2001
- [c4]Rainer Dorsch, Hans-Joachim Wunderlich:
Using mission logic for embedded testing. DATE 2001: 805 - [c3]Rainer Dorsch, Hans-Joachim Wunderlich:
Reusing scan chains for test pattern decompression. ETW 2001: 124-132 - [c2]Rainer Dorsch, Hans-Joachim Wunderlich:
Tailoring ATPG for embedded testing. ITC 2001: 530-537 - 1998
- [c1]Rainer Dorsch, Hans-Joachim Wunderlich:
Accumulator based deterministic BIST. ITC 1998: 412-421
Coauthor Index
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