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Farrokh Ghani Zadegan
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2020 – today
- 2022
- [c17]Farrokh Ghani Zadegan, Zilin Zhang, Kim Petersén, Erik Larsson:
Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus. ITC 2022: 219-228
2010 – 2019
- 2018
- [j4]Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson:
On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks. IEEE Trans. Computers 67(2): 237-251 (2018) - [j3]Riccardo Cantoro, Farrokh Ghani Zadegan, Marco Palena, Paolo Pasini, Erik Larsson, Matteo Sonza Reorda:
Test of Reconfigurable Modules in Scan Networks. IEEE Trans. Computers 67(12): 1806-1817 (2018) - 2017
- [b1]Farrokh Ghani Zadegan:
Reconfigurable On-Chip Instrument Access Networks: Analysis, Design, Operation, and Application. Lund University, Sweden, 2017 - 2016
- [c16]Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson:
On the diagnostic analysis of IEEE 1687 networks. ETS 2016: 1-2 - [c15]Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson:
A self-reconfiguring IEEE 1687 network for fault monitoring. ETS 2016: 1-6 - [c14]Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson:
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks. IOLTS 2016: 167-172 - [c13]Anton Tsertov, Artur Jutman, Sergei Devadze, Matteo Sonza Reorda, Erik Larsson, Farrokh Ghani Zadegan, Riccardo Cantoro, Mehrdad Montazeri, Rene Krenz-Baath:
A suite of IEEE 1687 benchmark networks. ITC 2016: 1-10 - [c12]Farrokh Ghani Zadegan, Rene Krenz-Baath, Erik Larsson:
Upper-bound computation for optimal retargeting in IEEE1687 networks. ITC 2016: 1-10 - [c11]Erik Larsson, Farrokh Ghani Zadegan:
Accessing on-chip instruments through the life-time of systems. LATS 2016: 2-4 - [c10]Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson:
In-field system-health monitoring based on IEEE 1687. SoCC 2016: 69-74 - 2015
- [c9]Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson:
On the testability of IEEE 1687 networks. ATS 2015: 211-216 - [c8]Rene Krenz-Baath, Farrokh Ghani Zadegan, Erik Larsson:
Access time minimization in IEEE 1687 networks. ITC 2015: 1-10 - 2014
- [c7]Farrokh Ghani Zadegan, Erik Larsson, Artur Jutman, Sergei Devadze, Rene Krenz-Baath:
Design, Verification, and Application of IEEE 1687. ATS 2014: 93-100 - [c6]Kim Petersén, Dimitar Nikolov, Urban Ingelsson, Gunnar Carlsson, Farrokh Ghani Zadegan, Erik Larsson:
Fault injection and fault handling: An MPSoC demonstrator using IEEE P1687. IOLTS 2014: 170-175 - [c5]Farrokh Ghani Zadegan, Gunnar Carlsson, Erik Larsson:
Robustness of TAP-based scan networks. ITC 2014: 1-10 - 2012
- [j2]Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson:
Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687. IEEE Des. Test Comput. 29(2): 79-88 (2012) - [j1]Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson:
Access Time Analysis for IEEE P1687. IEEE Trans. Computers 61(10): 1459-1472 (2012) - [c4]Erik Larsson, Farrokh Ghani Zadegan:
Accessing Embedded DfT Instruments with IEEE P1687. Asian Test Symposium 2012: 71-76 - 2011
- [c3]Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson, Erik Larsson:
Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints. Asian Test Symposium 2011: 525-531 - [c2]Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson:
Design automation for IEEE P1687. DATE 2011: 1412-1417 - 2010
- [c1]Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson:
Test Time Analysis for IEEE P1687. Asian Test Symposium 2010: 455-460
Coauthor Index
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