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Yi Zhao 0015
Person information
- affiliation: Zhejiang University, College of Information Science and Electronic Engineering, Hangzhou, China
Other persons with the same name
- Yi Zhao — disambiguation page
- Yi Zhao 0001 — University of Southampton, UK
- Yi Zhao 0002
— Shenzhen University, College of Mathematics and Statistics, China (and 1 more)
- Yi Zhao 0003 — Marvell Semiconductor, Santa Clara, CA, USA (and 1 more)
- Yi Zhao 0004
— Ohio State University, Columbus, OH, USA (and 1 more)
- Yi Zhao 0005
— Georgia State University, Department of Mathematics and Statistics, Atlanta, GA, USA
- Yi Zhao 0006
— University of Tokyo, Department of Electrical Engineering and Information Systems, Japan
- Yi Zhao 0007
— Harbin Institute of Technology, Shenzhen Graduate School, College of Science, China (and 1 more)
- Yi Zhao 0008
— Xiamen University, Department of Chemistry, China
- Yi Zhao 0009
— Hohai University, Department of Geomatics Engineering, Nanjing, China
- Yi Zhao 0010
— Beijing University of Chemical Technology, Beijing Key Laboratory for Health Monitoring and Self-Recovery of High End Mechanical Equipment, China
- Yi Zhao 0011
— Beijing Institute of Technology, China (and 1 more)
- Yi Zhao 0012 — University of Bonn, Germany
- Yi Zhao 0013
— Chinese Academy of Sciences, Institute Of Computing Technology, Bioinformatics Research Group, Beijing, China
- Yi Zhao 0014 — Aalto University, Espoo, Finland
- Yi Zhao 0016
— Tsinghua University, School of Software, BNRist, Beijing, China
- Yi Zhao 0017
— Uppsala University, Department of Information Technology, Sweden
- Yi Zhao 0018
— Huawei, Shuhai Lab, China (and 1 more)
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Journal Articles
- 2025
- [j3]Xiaoqian Huang
, Yong Gong
, Wenhao Wu, Saike Zhu
, Yi Zhao:
CSDet: A Compressed Sensing Object Detection Architecture With Lightweight Networks. IEEE Trans. Circuits Syst. Video Technol. 35(3): 2355-2368 (2025) - 2024
- [j2]Saike Zhu
, Cimang Lu, Xiang Qiu
, Shifan Gao
, Xiang Ding
, Youngseo Kim, Yi Zhao
:
Mitigating RC-Delay Induced Accuracy Loss in Analog In-Memory Computing: A Non-Compromising Approach. IEEE Trans. Consumer Electron. 70(4): 7544-7550 (2024) - 2018
- [j1]Yiming Qu
, Bing Chen, Wei Liu, Jinghui Han, Jiwu Lu, Yi Zhao:
Sub-1 ns characterization methodology for transistor electrical parameter extraction. Microelectron. Reliab. 85: 93-98 (2018)
Conference and Workshop Papers
- 2024
- [c16]Yiming Qu, Chu Yan, Yaru Ding, Yi Zhao:
Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs. IRPS 2024: 1-6 - [c15]Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao:
Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs. IRPS 2024: 1-6 - [c14]Zeping Weng
, Zhangsheng Lan
, Yaru Ding, Yiming Qu, Yi Zhao:
Orthorhombic-I Phase and Related Phase Transitions: Mechanism of Superior Endurance $(> 10^{14})$ of HfZrO Anti-ferroelectrics for DRAM Applications. IRPS 2024: 11 - 2023
- [c13]Yaru Ding, Xinwei Yu, Chu Yan, Zeping Weng, Yiming Qu, Yi Zhao:
Interval time dependent wake-up effect of HfZrO ferroelectric capacitor. IRPS 2023: 1-4 - [c12]Yiming Qu, Chu Yan, Xinwei Yu, Yaru Ding, Yi Zhao:
GHz Cycle-to-Cycle Variation in Ultra-scaled FinFETs: From the Time-Zero to the Aging States. IRPS 2023: 1-6 - [c11]Xinwei Yu, Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao:
GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model. IRPS 2023: 1-6 - 2022
- [c10]Yiming Qu, Yang Shen, Mingji Su
, Jiwu Lu, Yi Zhao:
GHz C-V Characterization Methodology and Its Application for Understanding Polarization Behaviors in High-k Dielectric Films. IRPS 2022: 3 - [c9]Chu Yan
, Yaru Ding, Yiming Qu, Liang Zhao, Yi Zhao:
Universal Hot Carrier Degradation Model under DC and AC Stresses. IRPS 2022: 7 - [c8]Yaru Ding
, Wei Liu, Yiming Qu, Liang Zhao, Yi Zhao:
Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress. IRPS 2022: 50-1 - 2021
- [c7]Liang Zhao, Shifan Gao, Shengbo Zhang, Xiang Qiu, Fan Yang, Jie Li, Zezhi Chen, Yi Zhao:
Neural Network Acceleration and Voice Recognition with a Flash-based In-Memory Computing SoC. AICAS 2021: 1-5 - [c6]Shifan Gao, Fan Yang, Liang Zhao, Yi Zhao:
Current Research Status and Future Prospect of the In-Memory Computing. ASICON 2021: 1-4 - [c5]Liang Zhao, Chu Yan
, Fan Yang, Shifan Gao, Gabriel Rosca, Dan Manea, Zhichao Lu, Yi Zhao:
A Compute-in-Memory Architecture Compatible with 3D NAND Flash that Parallelly Activates Multi-Layers. DAC 2021: 193-198 - [c4]Wei Liu
, Yaru Ding, Liang Zhao, Yi Zhao:
Nanosecond-scale and self-heating free characterization of advanced CMOS transistors utilizing wave reflection. IRPS 2021: 1-5 - 2020
- [c3]Yiming Qu, Jiwu Lu, Junkang Li, Zhuo Chen, Jie Zhang, Chunlong Li, Shiuh-Wuu Lee, Yi Zhao:
In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation. IRPS 2020: 1-6 - 2019
- [c2]Shifan Gao
, Bing Chen, Nuo Xu, Yiming Qu, Yi Zhao:
Probing Write Error Rate and Random Telegraph Noise of MgO Based Magnetic Tunnel Juction Using a High Throughput Characterization System. IRPS 2019: 1-4 - 2018
- [c1]Yiming Qu, Ran Cheng, Wei Liu, Junkang Li, Bich-Yen Nguyen, Olivier Faynot, Nuo Xu, Bing Chen, Yi Zhao:
Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs. IRPS 2018: 6
Coauthor Index

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last updated on 2025-06-05 20:35 CEST by the dblp team
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