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Kai-Shun Hu
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2020 – today
- 2023
- [c9]Kai-Shun Hu, Hao-Yu Chi, I-Jye Lin, Yi-Hsuan Wu, Wei-Hsu Chen, Yi-Ting Hsieh:
Invited Paper: 2023 ICCAD CAD Contest Problem B: 3D Placement with Macros. ICCAD 2023: 1-6 - 2022
- [c8]Kai-Shun Hu, I-Jye Lin, Yu-Hui Huang, Hao-Yu Chi, Yi-Hsuan Wu, Cindy Chin-Fang Shen:
2022 ICCAD CAD Contest Problem B: 3D Placement with D2D Vertical Connections. ICCAD 2022: 94:1-94:5 - 2021
- [j2]Tao-Chun Yu, Shao-Yun Fang, Hsien-Shih Chiu, Kai-Shun Hu, Philip Hui-Yuh Tai, Cindy Chin-Fang Shen, Henry Sheng:
Pin Accessibility Prediction and Optimization With Deep-Learning-Based Pin Pattern Recognition. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(11): 2345-2356 (2021) - [c7]Tao-Chun Yu, Shao-Yun Fang, Hsien-Shih Chiu, Kai-Shun Hu, Chin-Hsiung Hsu, Philip Hui-Yuh Tai, Cindy Chin-Fang Shen:
Machine Learning-based Structural Pre-route Insertability Prediction and Improvement with Guided Backpropagation. ASP-DAC 2021: 678-683 - [c6]Kai-Shun Hu, Tao-Chun Yu, Ming-Jen Yang, Cindy Chin-Fang Shen:
2021 ICCAD CAD Contest Problem B: Routing with Cell Movement Advanced: Invited Paper. ICCAD 2021: 1-5 - 2020
- [c5]Kai-Shun Hu, Ming-Jen Yang, Tao-Chun Yu, Guan-Chuen Chen:
ICCAD-2020 CAD contest in Routing with Cell Movement : Invited Talk. ICCAD 2020: 69:1-69:4 - [c4]Tao-Chun Yu, Shao-Yun Fang, Hsien-Shih Chiu, Kai-Shun Hu, Philip Hui-Yuh Tai, Cindy Chin-Fang Shen, Henry Sheng:
Lookahead Placement Optimization with Cell Library-based Pin Accessibility Prediction via Active Learning. ISPD 2020: 65-72
2010 – 2019
- 2019
- [c3]Tao-Chun Yu, Shao-Yun Fang, Hsien-Shih Chiu, Kai-Shun Hu, Philip Hui-Yuh Tai, Cindy Chin-Fang Shen, Henry Sheng:
Pin Accessibility Prediction and Optimization with Deep Learning-based Pin Pattern Recognition. DAC 2019: 220 - 2017
- [c2]Kai-Shun Hu, Ming-Jen Yang, Yu-Hui Huang, Bing-Yi Wong, Cindy Chin-Fang Shen:
ICCAD-2017 CAD contest in net open location finder with obstacles: Invited paper. ICCAD 2017: 863-866
2000 – 2009
- 2009
- [j1]Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang:
LPTest: a Flexible Low-Power Test Pattern Generator. J. Electron. Test. 25(6): 323-335 (2009) - 2007
- [c1]Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang:
An Efficient Peak Power Reduction Technique for Scan Testing. ATS 2007: 111-114
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