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ORCIDTakuji Okamoto
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2000 – 2009
- 2007
[j11]Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
Detection of CMOS Open Node Defects by Frequency Analysis. IEICE Trans. Inf. Syst. 90-D(3): 685-687 (2007)- 2005
- [j10]Masahiro Kawai, Yoichiro Sato, Hiroto Kagotani, Takuji Okamoto:
Superconductive logic circuits constructed by the use of two thresholds of SQUID. Syst. Comput. Jpn. 36(2): 42-50 (2005) - 2004
- [j9]Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. IEICE Trans. Inf. Syst. 87-D(3): 551-556 (2004) - [j8]Mitsuyasu Kagiyama, Hiroyuki Michinishi, Hiroto Kagotani, Takuji Okamoto, Yasuo Ogasawara, Fumihiko Kajiya:
Model analysis of coronary hemodynamics incorporating autoregulation. Syst. Comput. Jpn. 35(14): 21-31 (2004) - 2003
- [c8]Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. Asian Test Symposium 2003: 406-411 - 2002
- [c7]Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. Asian Test Symposium 2002: 417-422 - 2001
- [c6]Hiroto Kagotani, Takuji Okamoto, Takashi Nanya:
Synthesis of four-phase asynchronous control circuits from pipeline dependency graphs. ASP-DAC 2001: 425-430 - [c5]Nariyoshi Yamai, Kiyohiko Okayama, Hiroshi Shimamoto, Takuji Okamoto:
A dynamic traffic sharing with minimal administration on multihomed networks. ICC 2001: 1506-1510 - 2000
- [j7]Yoichiro Sato, Yoshinobu Yamasoto, Masanori Saito, Hiroto Kagotani, Takuji Okamoto, Masahiro Kawai:
Systematic reducing of metastable operations in CMOS D flip-flops. Syst. Comput. Jpn. 31(3): 20-28 (2000) - [j6]Hiroto Kagotani, Yoichiro Sato, Yoshimichi Takahara, Takuji Okamoto:
A method of affine transformation for rectangular video image. Syst. Comput. Jpn. 31(7): 75-85 (2000)
1990 – 1999
- 1997
- [c4]Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara:
Testing for the programming circuit of LUT-based FPGAs. Asian Test Symposium 1997: 242-247 - 1996
- [j5]Yoichiro Sato, Takuji Okamoto, Yuji Sugiyama, Masahiro Kawai, Toshifumi Kobayashi:
A method of shortening metastable operation duration time by the use of feedback. Syst. Comput. Jpn. 27(10): 23-32 (1996) - [j4]Toshiyuki Maeda, Yoichiro Sato, Tokumi Yokohira, Takuji Okamoto:
Realization of multiwindow system with high-speed operations of nonrectangular windows. Syst. Comput. Jpn. 27(10): 48-58 (1996) - [j3]Atsushi Ohnishi, Yuji Sugiyama, Takuji Okamoto:
Timing verification of asynchronous sequential circuits with specifications - A method of reducing state transitions to be verified in detail. Syst. Comput. Jpn. 27(11): 53-63 (1996) - [c3]Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara:
A Test Methodology for Interconnect Structures of LUT-based FPGAs. Asian Test Symposium 1996: 68-74 - 1995
- [j2]Tokumi Yokohira, Toshimi Shimizu, Hiroyuki Michinishi, Yuji Sugiyama, Takuji Okamoto:
The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs. IEICE Trans. Inf. Syst. 78-D(7): 874-881 (1995) - [c2]Tomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto:
Universal test complexity of field-programmable gate arrays. Asian Test Symposium 1995: 259-265 - 1991
- [j1]Toshiyuki Maeda, Yoichiro Sato, Tokumi Yokohira, Takuji Okamoto:
Decentralized priority encoder and its applications. Syst. Comput. Jpn. 22(10): 9-17 (1991)
1980 – 1989
- 1983
- [c1]Takuji Okamoto, Hiroyuki Shibata, Kozo Kinoshita:
Design of High-Level Test Language for Digital LSI. ITC 1983: 508-513
Coauthor Index
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