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Dariusz Czysz
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2020 – today
- 2023
- [j6]Pawel Sip, Marta Kozlowska, Dariusz Czysz, Przemyslaw Daroszewski, Przemyslaw Lisinski:
Perspectives of Motor Functional Upper Extremity Recovery with the Use of Immersive Virtual Reality in Stroke Patients. Sensors 23(2): 712 (2023)
2010 – 2019
- 2013
- [j5]Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
On Deploying Scan Chains for Data Storage in Test Compression Environment. IEEE Des. Test 30(1): 68-76 (2013) - 2012
- [c8]Dariusz Czysz, Janusz Rajski, Jerzy Tyszer:
Low power test application with selective compaction in VLSI designs. ITC 2012: 1-10 - 2011
- [j4]Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Przemyslaw Szczerbicki, Jerzy Tyszer:
Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(8): 1225-1238 (2011) - [c7]Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
Reduced ATE Interface for High Test Data Compression. ETS 2011: 99-104 - 2010
- [j3]Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
On Compaction Utilizing Inter and Intra-Correlation of Unknown States. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(1): 117-126 (2010) - [c6]Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Przemyslaw Szczerbicki, Jerzy Tyszer:
Low power compression of incompatible test cubes. ITC 2010: 704-713
2000 – 2009
- 2009
- [j2]Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low-Power Scan Operation in Test Compression Environment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(11): 1742-1755 (2009) - [c5]Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer:
Compression based on deterministic vector clustering of incompatible test cubes. ITC 2009: 1-10 - [c4]Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer:
Highly X-Tolerant Selective Compaction of Test Responses. VTS 2009: 245-250 - 2008
- [j1]Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low-Power Test Data Application in EDT Environment Through Decompressor Freeze. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(7): 1278-1290 (2008) - [c3]Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low Power Scan Shift and Capture in the EDT Environment. ITC 2008: 1-10 - 2007
- [c2]Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer:
New Test Data Decompressor for Low Power Applications. DAC 2007: 539-544 - [c1]Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low Power Embedded Deterministic Test. VTS 2007: 75-83
Coauthor Index
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