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M. A. Exarchos
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2000 – 2009
- 2009
- [j9]M. A. Exarchos, George J. Papaioannou
, Jalal Jomaah, Francis Balestra:
Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs. Microelectron. Reliab. 49(9-11): 1018-1023 (2009) - 2008
- [j8]Despina C. Moschou
, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou
, Aggeliki Arapoyanni, Apostolos T. Voutsas:
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. Microelectron. Reliab. 48(8-9): 1544-1548 (2008) - 2007
- [j7]Despina C. Moschou
, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou
, Apostolos T. Voutsas:
Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques. Microelectron. Reliab. 47(9-11): 1378-1383 (2007) - [j6]Loukas Michalas
, M. A. Exarchos, George J. Papaioannou
, Dimitrios N. Kouvatsos, Apostolos T. Voutsas:
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors. Microelectron. Reliab. 47(12): 2058-2064 (2007) - 2006
- [j5]M. A. Exarchos, E. Papandreou, Patrick Pons
, Mohamed Lamhamdi, George J. Papaioannou
, Robert Plana
:
Charging of radiation induced defects in RF MEMS dielectric films. Microelectron. Reliab. 46(9-11): 1695-1699 (2006) - 2005
- [j4]M. A. Exarchos, George J. Papaioannou
, Jalal Jomaah, Francis Balestra:
The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs. Microelectron. Reliab. 45(9-11): 1386-1389 (2005) - [j3]M. A. Exarchos, V. Theonas, Patrick Pons
, George J. Papaioannou
, S. Mellé, David Dubuc, Fabio Coccetti, Robert Plana
:
Investigation of charging mechanisms in metal-insulator-metal structures. Microelectron. Reliab. 45(9-11): 1782-1785 (2005) - 2004
- [j2]Dimitrios N. Kouvatsos, Vojkan Davidovic
, George J. Papaioannou
, Ninoslav Stojadinovic, Loukas Michalas
, M. A. Exarchos, Apostolos T. Voutsas, Dimitrios Goustouridis
:
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectron. Reliab. 44(9-11): 1631-1636 (2004) - [j1]M. A. Exarchos, François Dieudonné, Jalal Jomaah, George J. Papaioannou, Francis Balestra:
On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs. Microelectron. Reliab. 44(9-11): 1643-1647 (2004)
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