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Biswajit Bhowmik
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2020 – today
- 2023
- [j11]Biswajit Bhowmik, Shrinidhi Anil Varna, Adarsh Kumar, Rahul Kumar:
AutoCov22: A Customized Deep Learning Framework for COVID-19 Detection. SN Comput. Sci. 4(5): 659 (2023) - [j10]Biswajit Bhowmik:
Detection and Localization of Channel-Short Faults in Regular On-Chip Interconnection Networks. SN Comput. Sci. 4(5): 660 (2023) - [c30]Hindu Angalakuditi, Biswajit Bhowmik:
Stress Detection Using Deep Learning Algorithms. ICCCNT 2023: 1-7 - [c29]Girish K. K, Biswajit Bhowmik:
Recent Advancements and Challenges in FinTech. ICCCNT 2023: 1-7 - 2022
- [c28]Prachi Kale, Pallabi Hazarika, Sajal Jain, Biswajit Bhowmik:
Performance Evaluation in 2D NoCs Using ANN. AINA (3) 2022: 360-369 - [c27]Anil Verma, Biswajit Bhowmik:
Automated Detection of Maize Leaf Diseases in Agricultural Cyber-Physical Systems. MED 2022: 841-846 - 2021
- [j9]Biswajit Bhowmik, Pallabi Hazarika, Prachi Kale, Sajal Jain:
AI Technology for NoC Performance Evaluation. IEEE Trans. Circuits Syst. II Express Briefs 68(12): 3483-3487 (2021) - [j8]Biswajit Bhowmik:
Dugdugi: An Optimal Fault Addressing Scheme for Octagon-Like On-Chip Communication Networks. IEEE Trans. Very Large Scale Integr. Syst. 29(5): 1009-1021 (2021) - [c26]Gagan N, Biswajit Bhowmik:
TLM-NoC: Two Level Mesh Network-on-Chip for Performance Improvement. HPCC/DSS/SmartCity/DependSys 2021: 813-818 - [c25]Biswajit Bhowmik, Shrinidhi Anil Varna, Adarsh Kumar, Rahul Kumar:
Reducing False Prediction On COVID-19 Detection Using Deep Learning. MWSCAS 2021: 404-407 - [c24]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
Selective Fault-Masking for Improving Yield and Performance of On-Chip Networks. SMC 2021: 3336-3341 - [c23]Gagan N, Biswajit Bhowmik:
Topology Exploration for Long-Distance Communication. TENCON 2021: 875-880 - 2020
- [j7]Biswajit Bhowmik:
Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks. J. Electron. Test. 36(3): 385-408 (2020) - [c22]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
Reliability Monitoring in a Smart NoC Component. ICECS 2020: 1-4 - [c21]Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka, Bhargab B. Bhattacharya:
Locating Open-Channels in Octagon Networks on Chip-Microprocessors. ISVLSI 2020: 200-205 - [c20]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
Improving Reliability in Spidergon Network on Chip-Microprocessors. MWSCAS 2020: 474-477 - [c19]Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka:
Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC Channels. SMC 2020: 2339-2344
2010 – 2019
- 2019
- [j6]Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka, Bhargab B. Bhattacharya:
A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip. J. Electron. Test. 35(2): 215-243 (2019) - [j5]Biswajit Bhowmik:
A Power-Aware Fault Detection Scheme for 2D Mesh-Based Network-on-Chip Interconnects. J. Low Power Electron. 15(2): 256-272 (2019) - [j4]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas, Bhargab B. Bhattacharya:
Performance-Aware Test Scheduling for Diagnosing Coexistent Channel Faults in Topology-Agnostic Networks-on-Chip. ACM Trans. Design Autom. Electr. Syst. 24(2): 17:1-17:29 (2019) - 2018
- [j3]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
On-Line Analysis of Stuck-at Faults in On-Chip Network Interconnects. J. Circuits Syst. Comput. 27(13): 1850203:1-1850203:13 (2018) - [j2]Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka, Bhargab B. Bhattacharya:
Reliability-Aware Test Methodology for Detecting Short-Channel Faults in On-Chip Networks. IEEE Trans. Very Large Scale Integr. Syst. 26(6): 1026-1039 (2018) - [c18]Biswajit Bhowmik:
A Time-optimized Test-Solution Scheme for the Analysis of Permanent Faults on NoC Interconnects. ISED 2018: 188-193 - [c17]Biswajit Bhowmik:
Heaping of Sorrow Upon Sorrow. iSES 2018: 177-182 - 2017
- [j1]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
A Time-Optimized Scheme Towards Analysis of Channel-Shorts in on-Chip Networks. J. Electron. Test. 33(2): 227-254 (2017) - [c16]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
Charka: A reliability-aware test scheme for diagnosis of channel shorts beyond mesh NoCs. DATE 2017: 214-219 - 2016
- [c15]Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka:
A Reliability-Aware Topology-Agnostic Test Scheme for Detecting, and Diagnosing Interconnect Shorts in On-chip Networks. HPCC/SmartCity/DSS 2016: 530-537 - [c14]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
When Clustering Shows Optimality towards Analyzing Stuck-at Faults in Channels of On-chip Networks. HPCC/SmartCity/DSS 2016: 868-875 - [c13]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
An on-line test solution for addressing interconnect shorts in on-chip networks. IOLTS 2016: 9-12 - [c12]Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka:
An odd-even scheme to prevent a packet from being corrupted and dropped in fault tolerant NoCs. IOLTS 2016: 195-198 - [c11]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
Towards a Scalable Test Solution for the Analysis of Interconnect Shorts in On-chip Networks. MASCOTS 2016: 394-399 - [c10]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas, Bhargab B. Bhattacharya:
A topology-agnostic test model for link shorts in on-chip networks. SMC 2016: 4561-4566 - [c9]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas, Bhargab B. Bhattacharya:
On-line detection and diagnosis of stuck-at faults in channels of NoC-based systems. SMC 2016: 4567-4572 - [c8]Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka, Bhargab B. Bhattacharya:
Detecting and diagnosing open faults in NoC channels on activation of diagonal nodes. SMC 2016: 4573-4578 - [c7]Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka, Bhargab B. Bhattacharya:
One poison is antidote against another poison. SMC 2016: 4579-4584 - 2015
- [c6]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
Reliability on Top of Best Effort Delivery: Maximal Connectivity Test on NoC Interconnects. COMPUTE 2015: 19-28 - [c5]Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka:
A packet address driven test strategy for stuck-at faults in networks-on-chip interconnects. MED 2015: 176-183 - [c4]Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
Directed Symbolic Execution for VLSI Circuits. SMC 2015: 50-55 - [c3]Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka:
An Optimal Diagnosis of NoC Interconnects on Activation of Diagonal Routers. SMC 2015: 755-760 - 2014
- [c2]Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka:
Detection of faulty interswitch links in 2-D mesh network-on-chips. IEEE ANTS 2014: 1-6 - 2010
- [c1]P. K. Guha Thakurta, Souvik Sonar, Biswajit Bhowmik, Swapan Bhattacharya, Subhansu Bandyopadhyay:
A New Approach on Priority Queue based Scheduling with Handoff Management for Mobile Networks. SEDE 2010: 69-74
Coauthor Index
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