"Logic-DRAM Co-Design to Exploit the Efficient Repair Technique for Stacked ..."

Minjie Lv et al. (2015)

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DOI: 10.1109/TCSI.2015.2403031

access: closed

type: Journal Article

metadata version: 2022-01-03

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Minjie Lv, Hongbin Sun, Qiwei Ren, Bing Yu, Jingmin Xin, Nanning Zheng:
Logic-DRAM Co-Design to Exploit the Efficient Repair Technique for Stacked DRAM. IEEE Trans. Circuits Syst. I Regul. Pap. 62-I(5): 1362-1371 (2015)

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