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ORCID9th EMC Compo 2013: Nara, Japan
- 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013. IEEE 2013
- Osami Wada:
Chair's welcome. 1 - Tomohiro Kinoshita, Shoichi Hara, Eiji Takahashi, Kazuhide Uriu:
A technique for estimating signal waveforms at inaccessible points in high speed digital circuits. 1-4 - Heegon Kim, Jonghyun Cho, Daniel H. Jung, Jonghoon J. Kim, Sumin Choi, Joungho Kim, Junho Lee, Kunwoo Park:
Design and measurement of a compact on-interposer passive equalizer for chip-to-chip high-speed differential signaling. 5-9 - Etienne Sicard, Jianfei Wu, Jiancheng Li:
Signal integrity and EMC performance enhancement using 3D integrated circuits - A case study. 10-14 - Sjoerd Op't Land, Richard Perdriau, Mohammed Ramdani, Olivier Maurice
, M'hamed Drissi:
Kron simulation of field-to-line coupling using a meshed and a modified Taylor cell. 15-20 - Umberto Paoletti, Takashi Suga:
Extraction of deterministic and random LSI noise models with the printed reverberation board. 21-26 - Renaud Gillon, Niko Bako, Adrijan Baric:
Broadband detection of radiating moments using the TEM-cell and a phase-calibrated oscilloscope. 27-32 - Atsushi Nakamura, Masaaki Maeda, Tohlu Matsushima, Osami Wada:
Substrate noise reduction based on impedance balance using tunable resistances. 33-36 - Makoto Nagata, Shunsuke Shimazaki, Naoya Azuma, Satoru Takahashi, Motoki Murakami, Kazuaki Hori, Satoshi Tanaka, Masahiro Yamaguchi:
Measurement-based diagnosis of wireless communication performance in the presence of in-band interferers in RF ICs. 37-41 - Naoya Azuma, Shunsuke Shimazaki, Noriyuki Miura, Makoto Nagata, Tomomitsu Kitamura, Satoru Takahashi, Motoki Murakami, Kazuaki Hori, Atsushi Nakamura, Kenta Tsukamoto, Mizuki Iwanami, Eiji Hankui, Sho Muroga, Yasushi Endo, Satoshi Tanaka, Masahiro Yamaguchi:
Measurements and simulation of substrate noise coupling in RF ICs with CMOS digital noise emulator. 42-46 - Sho Muroga, Y. Shimada, Yasushi Endo, Satoshi Tanaka, Masahiro Yamaguchi, Naoya Azuma, Makoto Nagata, Motoki Murakami, Kazuaki Hori, Satoru Takahashi:
In-band spurious attenuation in LTE-class RFIC chip using a soft magnetic thin film. 47-52 - Siham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp:
Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling. 53-58 - Tohlu Matsushima, Nobuaki Ikehara, Takashi Hisakado, Osami Wada:
Improvement of reproducibility of DPI method to quantify RF conducted immunity of LDO regulator. 59-62 - Sergey Miropolsky, Alexander Sapadinsky, Stephan Frei:
A generalized accurate modelling method for automotive bulk current injection (BCI) test setups up to 1 GHz. 63-68 - Tvrtko Mandic, Renaud Gillon, Adrijan Baric:
IC-Stripline design optimization using response surface methodology. 69-73 - L. Guibert, P. Millot, Xavier Ferrières, Etienne Sicard:
Study of radiated immunity of an electronic system in a reverberating chamber. 74-77 - Yu-ichi Hayashi, Naofumi Homma, Takafumi Aoki, Yuichiro Okugawa, Yoshiharu Akiyama:
Transient analysis of EM radiation associated with information leakage from cryptographic ICs. 78-82 - KyungSoo Kim, Wansoo Nah, SoYoung Kim:
Noise-immune design of Schmitt trigger logic gate using DTMOS for sub-threshold circuits. 83-88 - C. Oliveira, Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez, Alexandre Boyer:
Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI. 89-94 - Jérémy Raoult, A. Blain, Sylvie Jarrix:
An optimizing technique to lower both phase noise and susceptibility of a voltage controlled oscillator. 95-100 - Alexis Schindler, Benno Koeppl, Bernhard Wicht:
EMC analysis of current source gate drivers. 101-106 - Philipp Schröter, Stefan Jahn, Frank Klotz, Fabio Ballarin, Fabio Gini, Marco Piselli:
EMI resisting LDO voltage regulator with integrated current monitor. 107-112 - Tsuyoshi Funaki:
A study on gate voltage fluctuation of MOSFET induced by switching operation of adjacent MOSFET in high voltage power conversion circuit. 113-118 - Wei-li Sun, Feng-Chang Chuang, Yu-Lin Song, Chwen Yu, Tzyh-Ghuang Ma, Tzong-Lin Wu, Luh-Maan Chang:
Active magnetic field canceling system. 119-122 - Bernd Deutschmann:
Spread spectrum clocking for emission reduction of charge pump applications. 123-128 - Marco Cazzaniga, Patrice Joubert Doriol, Aurora Sanna, Emmanuel Blanc, Valentino Liberali, Davide Pandini:
Evaluating the impact of substrate noise on conducted EMI in automotive microcontrollers. 129-133 - Masaaki Maeda, Tohlu Matsushima, Osami Wada:
Impedance balance control for suppression of fluctuation on ground voltage in LSI package. 134-137 - Shih-Yi Yuan, Shry-Sann Liao:
Automatic conducted-EMI microcontroller model building. 138-141 - Haruya Fujita, Hiroki Takatani, Yosuke Tanaka, Shohei Kawaguchi, Masaomi Sato, Toshio Sudo:
Evaluation of PDN impedance and power supply noise for different on-chip decoupling structures. 142-146 - Néstor Berbel, Raúl Fernández-García, Ignacio Gil:
Characterization of conducted emission at high frequency under different temperature. 147-151 - André Durier, Christian Marot, Olivier Crépel:
Using the EM simulation tools to predict the Conducted Emissions level of a DC/DC boost converter: Introducing EBEM-CE model. 152-157 - Jonghoon J. Kim, Heegon Kim, Sukjin Kim, Bumhee Bae, Daniel H. Jung, Sunkyu Kong, Joungho Kim, Junho Lee, Kunwoo Park:
Design of contactless wafer-level TSV connectivity testing structure using capacitive coupling. 158-162 - Daniel H. Jung, Heegon Kim, Jonghoon J. Kim, Joungho Kim, Hyun-Cheol Bae, Kwang-Seong Choi:
Modeling and analysis of open defect in through silicon via (TSV) channel. 163-166 - Yin-Cheng Chang, Shawn S. H. Hsu, Yen-Tang Chang, Chiu-Kuo Chen, Hsu-Chen Cheng, Da-Chiang Chang:
The direct RF power injection method up to 18 GHz for investigating IC's susceptibility. 167-170 - Wataru Ichimura, Sho Kiyoshige, Masahiro Terasaki, Ryota Kobayashi, Genki Kubo, Hiroki Otsuka, Toshio Sudo:
Anti-resonance peak frequency control by variable on-die capacitance. 171-174 - Kengo Iokibe, Yoshitaka Toyota:
Estimation of data-dependent power voltage variations of FPGA by equivalent circuit modeling from on-board measurements. 175-179 - Thomas Steinecke:
Microcontroller emission simulation based on power consumption and clock system. 180-185 - Shih-Yi Yuan:
A microcontrller conducted EMI model building for software-level effect. 186-189 - Alexandre Boyer, Sonia Ben Dhia:
Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission. 190-195 - Thomas Steinecke, Markus Unger, Stanislav Scheier, Stephan Frei, Josip Bacmaga, Adrijan Baric:
System-ESD validation of a microcontroller with external RC-filter. 196-201 - Bertrand Vrignon, P. Caunegre, John Shepherd, Jianfei Wu:
Automatic verification of EMC immunity by simulation. 202-207 - Sonia Ben Dhia, Alexandre Boyer:
Electro-magnetic robustness of integrated circuits: from statement to prediction. 208-213 - Hermann Nzalli, Wolfgang Wilkening, Rolf H. Jansen:
EMC immunity of integrated smart power transistors in a non-50Ω environment. 214-219 - Sylvie Jarrix, Jérémy Raoult, Adrien Doridant, Clovis Pouant, Patrick Hoffmann:
Discrete low-frequency transistors subjected to high-frequency CW and pulse-modulated sine signals. 220-225 - Akitaka Murata, Shuji Agatsuma, Daisaku Ikoma, Kouji Ichikawa, Takahiro Tsuda, Makoto Nagata, Kumpei Yoshikawa, Yuuki Araga, Yuji Harada:
Noise analysis using on-chip waveform monitor in bandgap voltage references. 226-231 - Kumpei Yoshikawa, Yuji Harada, Noriyuki Miura, Noriaki Takeda, Yoshiyuki Saito, Makoto Nagata:
Immunity evaluation of inverter chains against RF power on power delivery network. 232-237 - Bumhee Bae, Sunkyu Kong, Jonghoon J. Kim, Sukjin Kim, Joungho Kim:
Magnetic field coupling on analog-to-digital converter from wireless power transfer system in automotive environment. 238-242 - Yosuke Kondo, Kei Tsunada, Norimasa Oka, Masato Izumichi:
Immunity simulation method for automotive power module using electromagnetic analysis. 243-248 - Hugo Pues, Ben Brike, Celina Gazda, Peter Teichmann, Kristof Stijnen, Christian Peeters, André Durier, Dries Vande Ginste:
Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models. 249-253
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