![](https://dblp.dagstuhl.de/img/logo.ua.320x120.png)
![](https://dblp.dagstuhl.de/img/dropdown.dark.16x16.png)
![](https://dblp.dagstuhl.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.dagstuhl.de/img/search.dark.16x16.png)
![search dblp](https://dblp.dagstuhl.de/img/search.dark.16x16.png)
default search action
IEEE Design & Test of Computers, Volume 17
Volume 17, Number 1, January-March 2000
- Yervant Zorian:
Flexibility and Programmability. IEEE Des. Test Comput. 17(1): 3- (2000)
- News. IEEE Des. Test Comput. 17(1): 4-6 (2000)
- Patrick P. Gelsinger:
Discontinuities Driven by a Billion Connected Machines. 7-15
- Fadi J. Kurdahi, Nader Bagherzadeh, Peter Athanas, Jose L. Muñoz:
Guest Editors' Introduction: Configurable Computing. IEEE Des. Test Comput. 17(1): 17-19 (2000) - Brad L. Hutchings, Brent E. Nelson, Michael J. Wirthlin:
Designing and Debugging Custom Computing Applications. 20-28 - Nirmal R. Saxena, Santiago Fernández-Gomez, Wei-Je Huang, Subhasish Mitra
, Shu-Yi Yu, Edward J. McCluskey:
Dependable Computing and Online Testing in Adaptive and Configurable Systems. 29-41 - Bingxiong Xu, David H. Albonesi:
Runtime Reconfiguration Techniques for Efficient General-Purpose Computation. 42-52 - Daler N. Rakhmatov, Sarma B. K. Vrudhula, Thomas J. Brown, Ajay Nagarandal:
Adaptive Multiuser Online Reconfigurable Engine. 53-67 - Kia Bazargan, Ryan Kastner, Majid Sarrafzadeh:
Fast Template Placement for Reconfigurable Computing Systems. 68-83 - Sergio López-Buedo
, Javier Garrido Salas
, Eduardo I. Boemo
:
Thermal Testing on Reconfigurable Computers. 84-91
- Hardware-Software Codesign. IEEE Des. Test Comput. 17(1): 92-99 (2000)
- Mukund Modi:
TTTC Reports on Recent Standards Activities. IEEE Des. Test Comput. 17(1): 100-101 (2000)
- Panel Summaries. IEEE Des. Test Comput. 17(1): 102-105 (2000)
- Conference Reports. IEEE Des. Test Comput. 17(1): 106-107 (2000)
- TTTC Newsletter. IEEE Des. Test Comput. 17(1): 108-109 (2000)
- DATC Newsletter. IEEE Des. Test Comput. 17(1): 110- (2000)
- Scott Davidson:
Twenty Years Ago Today. IEEE Des. Test Comput. 17(1): 111-112 (2000)
Volume 17, Number 2, April-June 2000
- Yervant Zorian:
Embedded in this issue. IEEE Des. Test Comput. 17(2): 5-6 (2000)
- News. IEEE Des. Test Comput. 17(2): 6-9 (2000)
- Donatella Sciuto:
Guest Editor's Introduction: Design Tools for Embedded Systems. IEEE Des. Test Comput. 17(2): 11-13 (2000) - Marco Sgroi, Luciano Lavagno, Alberto L. Sangiovanni-Vincentelli
:
Formal Models for Embedded System Design. 14-27 - Frank Slomka, Matthias Dörfel, Ralf Münzenberger, Richard Hofmann:
Hardware/Software Codesign and Rapid Prototyping of Embedded Systems. 28-38 - Margarida F. Jacome, Gustavo de Veciana:
Design Challenges for New Application-Specific Processors. 40-50 - Michael Eisenring, Lothar Thiele, Eckart Zitzler:
Conflicting Criteria in Embedded System Design. 51-59 - Alberto Allara, Massimo Bombana, William Fornaciari
, Fabio Salice:
A Case Study in Design Space Exploration: The Tosca Environment Applied to a Telecommunication Link Controller. 60-72 - Luca Benini, Alberto Macii
, Enrico Macii, Massimo Poncino:
Increasing Energy Efficiency of Embedded Systems by Application-Specific Memory Hierarchy Generation. 74-85
- Keith A. Jenkins, James P. Eckhardt:
Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops. 86-93 - Dilip K. Bhavsar:
Synchronizing the IEEE 1149.1 Test Access Port for Chip-Level Testability. 94-99 - Janardhan H. Satyanarayana, Keshab K. Parhi
:
Power Estimation of Digital Data Paths Using HEAT. 101-110 - Hendrawan Soeleman, Kaushik Roy, Tan-Li Chou:
Estimating Circuit Activity in Combinational CMOS Digital Circuits. 112-119 - A D&T Roundtable: Design Automation in a Subwavelength Worl. IEEE Des. Test Comput. 17(2): 120-126 (2000)
- Conference Reports. IEEE Des. Test Comput. 17(2): 127-135 (2000)
- Panel Summaries. IEEE Des. Test Comput. 17(2): 136-139 (2000)
- DATC Newsletter. IEEE Des. Test Comput. 17(2): 140- (2000)
- TTTC Newsletter. IEEE Des. Test Comput. 17(2): 141- (2000)
- Mukund Modi:
SCC20 Reports on Recent Standards Activities. IEEE Des. Test Comput. 17(2): 142-143 (2000)
- In the Licensing Dungeon: CAD by the Minute. IEEE Des. Test Comput. 17(2): 143-144 (2000)
Volume 17, Number 3, July-September 2000
- Yervant Zorian:
Wider Coverage. 6-
- News. IEEE Des. Test Comput. 17(3): 8-10 (2000)
- Scott Davidson, Justin E. Harlow III:
Guest Editors' Introduction: Benchmarking for Design and Test. 12-14 - Justin E. Harlow III:
Overview of Popular Benchmark Sets. 15-17 - Rohit Kapur, Cy Hay, Thomas W. Williams:
The Mutating Metric for Benchmarking Test. 18-21 - Giulio Gorla, Eduard Moser, Wolfgang Nebel, Eugenio Villar
:
System Specification Experiments on a Common Benchmark. 22-32 - Chouki Aktouf, Hérvé Fleury, Chantal Robach:
Inserting Scan at the Behavioral Level. 34-42 - Fulvio Corno
, Matteo Sonza Reorda
, Giovanni Squillero
:
RT-Level ITC'99 Benchmarks and First ATPG Results. 44-53 - Luis Basto:
First Results of ITC'99 Benchmark Circuits. 54-59 - Sujit Dey, Debashis Panigrahi, Li Chen, Clark N. Taylor, Krishna Sekar, Pablo Sanchez:
Using a Soft Core in a SoC Design: Experiences with picoJava. 60-71
- Chien-Nan Jimmy Liu, Jing-Yang Jou:
An Automatic Controller Extractor for HDL Descriptions at the RTL. 72-77 - Axel Jantsch, Shashi Kumar, Ahmed Hemani:
A Metamodel for Studying Concepts in Electronic System Design. 78-85 - Rolf Clauberg
, Peter Buchmann, Andreas Herkersdorf, David J. Webb:
Design Methodology for a Large Communication Chip. 86-94 - Mauro Bertacchi, Alessandro De Gloria, Daniele Grosso, Mauro Olivieri
:
Semicustom Design of an IEEE 1394-Compliant Reusable IC Core. 95-105 - Pramodchandran N. Variyam, Abhijit Chatterjee:
Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling. 106-115 - Seung H. Hwang, Gwan S. Choi:
A Reliability Testing Environment for Off-the-Shelf Memory Subsystems. 116-124 - A D&T Roundtable: Test Resource Partitioning. IEEE Des. Test Comput. 17(3): 126-132 (2000)
- Panel Summaries. IEEE Des. Test Comput. 17(3): 133-135 (2000)
- Mukund Modi:
TTTC Reports on Recent Standards Activities. IEEE Des. Test Comput. 17(3): 136-137 (2000)
- DATC Newsletter. IEEE Des. Test Comput. 17(3): 139- (2000)
- TTTC Newsletter. IEEE Des. Test Comput. 17(3): 140-141 (2000)
- Franc Brglez:
The Scientific Method and Design and Test. 142-144
Volume 17, Number 4, October-December 2000
- D&T Elevated to Bimonthly. IEEE Des. Test Comput. 17(4): 3- (2000)
- Magdy S. Abadir, Sumit Dasgupta:
Guest Editors' Introduction: Microprocessor Test and Verification. IEEE Des. Test Comput. 17(4): 4-5 (2000) - Wei-Cheng Lai, Angela Krstic, Kwang-Ting (Tim) Cheng
:
Functionally Testable Path Delay Faults on a Microprocessor. 6-14 - Nektarios Kranitis
, Dimitris Gizopoulos, Antonis M. Paschalis
, Mihalis Psarakis, Yervant Zorian:
Power-/Energy Efficient BIST Schemes for Processor Data Paths. 15-28 - Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran:
Test Development for a Third-Version ColdFire Microprocessor. 29-37 - Noppanunt Utamaphethai, R. D. (Shawn) Blanton, John Paul Shen:
Effectiveness of Microarchitecture Test Program Generation. 38-49 - David Van Campenhout, Trevor N. Mudge, John P. Hayes:
Collection and Analysis of Microprocessor Design Errors. 51-60 - Narayanan Krishnamurthy, Andrew K. Martin, Magdy S. Abadir, Jacob A. Abraham:
Validating PowerPC Microprocessor Custom Memories. 61-76 - Hemant G. Rotithor:
Postsilicon Validation Methodology for Microprocessors. 77-88
- Subhasish Mitra
, LaNae J. Avra, Edward J. McCluskey:
Efficient Multiplexer Synthesis Techniques. 90-97 - A D&T Roundtable: Power Delivery and Distribution. 98-102
- Standards. IEEE Des. Test Comput. 17(4): 102-103 (2000)
- Panel Summaries. IEEE Des. Test Comput. 17(4): 104-105 (2000)
- TTTC Newsletter. IEEE Des. Test Comput. 17(4): 106-107 (2000)
- DATC Newsletter. IEEE Des. Test Comput. 17(4): 108- (2000)
- IEEE Design & Test of Computers 2000 Annual Index, Volume 17. IEEE Des. Test Comput. 17(4): 109-117 (2000)
- Scott Davidson:
Testing in 2100. IEEE Des. Test Comput. 17(4): 119-120 (2000)
![](https://dblp.dagstuhl.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.