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Jiayong Le
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2000 – 2009
- 2009
- [c8]Ayhan A. Mutlu, Jiayong Le, Ruben Molina, Mustafa Celik:
A parametric approach for handling local variation effects in timing analysis. DAC 2009: 126-129 - [c7]Ayhan A. Mutlu, Jiayong Le, Ruben Molina, Mustafa Celik:
Parametric analysis to determine accurate interconnect extraction corners for design performance. ISQED 2009: 419-423 - 2008
- [j3]Xin Li, Jiayong Le, Mustafa Celik, Lawrence T. Pileggi:
Defining Statistical Timing Sensitivity for Logic Circuits With Large-Scale Process and Environmental Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(6): 1041-1054 (2008) - 2007
- [j2]Xin Li, Jiayong Le, Padmini Gopalakrishnan, Lawrence T. Pileggi:
Asymptotic Probability Extraction for Nonnormal Performance Distributions. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(1): 16-37 (2007) - 2006
- [j1]Xin Li, Jiayong Le, Lawrence T. Pileggi:
Statistical Performance Modeling and Optimization. Found. Trends Electron. Des. Autom. 1(4) (2006) - [c6]Xin Li, Jiayong Le, Lawrence T. Pileggi:
Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions. DAC 2006: 103-108 - 2005
- [c5]Xin Li, Jiayong Le, Lawrence T. Pileggi, Andrzej J. Strojwas:
Projection-based performance modeling for inter/intra-die variations. ICCAD 2005: 721-727 - [c4]Xin Li, Jiayong Le, Mustafa Celik, Lawrence T. Pileggi:
Defining statistical sensitivity for timing optimization of logic circuits with large-scale process and environmental variations. ICCAD 2005: 844-851 - 2004
- [c3]Jiayong Le, Xin Li, Lawrence T. Pileggi:
STAC: statistical timing analysis with correlation. DAC 2004: 343-348 - [c2]Xin Li, Jiayong Le, Padmini Gopalakrishnan, Lawrence T. Pileggi:
Asymptotic probability extraction for non-normal distributions of circuit performance. ICCAD 2004: 2-9 - 2003
- [c1]Jiayong Le, Lawrence T. Pileggi, Anirudh Devgan:
Circuit Simulation of Nanotechnology Devices with Non-monotonic I-V Characteristics. ICCAD 2003: 491-496
Coauthor Index
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