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Sicong Yuan
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2020 – today
- 2024
- [c9]Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Diagnosis for Yield Learning in RRAMs. DATE 2024: 1-6 - [c8]Hanzhi Xun, Moritz Fieback
, Mohammad Amin Yaldagard
, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Online Detection of Unique Faults in RRAMs. ETS 2024: 1-2 - [c7]Sicong Yuan, Mohammad Amin Yaldagard
, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Design-for-Test for Intermittent Faults in STT-MRAMs. ETS 2024: 1-6 - 2023
- [c6]Ahmed Aouichi, Sicong Yuan, Moritz Fieback
, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Device Aware Diagnosis for Unique Defects in STT-MRAMs. ATS 2023: 1-6 - [c5]Hanzhi Xun, Moritz Fieback
, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui:
Characterization and Test of Intermittent Over RESET in RRAMs. ATS 2023: 1-6 - [c4]Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback
, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui:
Device-Aware Test for Back-Hopping Defects in STT-MRAMs. DATE 2023: 1-6 - [c3]Hanzhi Xun, Moritz Fieback
, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui:
Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. ETS 2023: 1-6 - [c2]Sicong Yuan, Z. Zhang, Moritz Fieback
, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. ITC 2023: 236-245 - [c1]Hanzhi Xun, Sicong Yuan, Moritz Fieback
, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test for Ion Depletion Defects in RRAMs. ITC 2023: 246-255
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last updated on 2024-08-05 20:26 CEST by the dblp team
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