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ORCID32nd Asian Test Symposium 2023: Beijing, China
- 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. IEEE 2023, ISBN 979-8-3503-0310-0
- Gaurav Kumar
, Anjum Riaz, Yamuna Prasad, Satyadev Ahlawat:
On Enhancing the Security of Streaming Scan Network Architecture. 1-6 - Lingjuan Wu, Yifei Gao, Jiacheng Zhu, Yu Tai, Wei Hu:
Security Verification of RISC-V System Based on ISA Level Information Flow Tracking. 1-6 - Yongquan Tan, Yukuan Yang, Hongping Ren, Zhuokun Yang, Qian Dong, Yunzhi Xue:
Survey on Traffic Flow-Based Autonomous Driving Simulation Tests. 1-6 - Shibo Tang, Jiacheng Zhu, Yifei Gao, Jing Zhou, Dejun Mu, Wei Hu:
Verifying RISC-V Privilege Transition Integrity Through Symbolic Execution. 1-6 - Leon Li, Alex Orailoglu:
ClearLock: Deterring Hardware Reverse Engineering Attacks in a White-Box. 1-6 - Zhiteng Chao, Senlin Wang, Pengyu Tian, Shuwen Yuan, Huawei Li, Jing Ye, Xiaowei Li:
A Distributed ATPG System Combining Test Compaction Based on Pure MaxSAT. 1-6 - Huawei Li, Jing Ye, Wei Hu, Jiliang Zhang:
Message from the Chairs. 1 - Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Device Aware Diagnosis for Unique Defects in STT-MRAMs. 1-6 - Wenxing Li, Hongqin Lyu, Shengwen Liang, Tiancheng Wang, Pengyu Tian, Huawei Li:
Intelligent Automatic Test Pattern Generation for Digital Circuits Based on Reinforcement Learning. 1-6 - Weiwei Wang, Yongchao Zhang, Feng You, Zhigang Yin, Ruilian Zhao:
Fault Diagnosis of Analog Circuits Based on Multi-Scale 1D Convolutional Neural Network. 1-6 - Lei Yue, Jingwen Li, Liwei Zheng, Li Li, Zhanqi Cui:
Software Fault Localization Based on Combining Information Retrieval and Mutation Analysis. 1-6 - Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich:
Optimizing the Streaming of Sensor Data with Approximate Communication. 1-6 - Jinhua Cui, Yiyun Yin, Zhiping Cai, Jiliang Zhang:
A Comparison Study of the Compatibility Approaches for SGX Enclaves. 1-6 - Shuting Kang, Heng Guo, Peng Su, Lijun Zhang, Guangzhen Liu, Yunzhi Xue, Yanjun Wu:
ECSAS: Exploring Critical Scenarios from Action Sequence in Autonomous Driving. 1-6 - Li-Wei Chen, Xianyue Zhao, Ziang Chen, Nan Du, Ilia Polian:
Side-channel Attacks on Memristive Circuits Under External Disturbances. 1-6 - Shi-Jie Ye, Yun-Ju Liu, Liuzheng Wang, Hui-Ling Zhen, Wei-Ming Zhang, Yu Huang:
Fault Simulation Acceleration Based on ARM Multi-core CPU Architecture. 1-5 - Yilin Li, Shan Li, Haihua Shen:
HTrans: Transformer-Based Method for Hardware Trojan Detection and Localization. 1-6 - Yue Cheng, Hongji Zou, Jiayu He, Chen Chen, Tun Li, Han Long:
MMFuzz: Towards Enhancing RTL Fuzz Testing Using Metric Feedbacks Based on Markov Chain. 1-6 - Xin Chen, Liangzhou Huo, Yudong Xie, Zhihao Shen, Zhiqiang Xiang, Changhao Gao, Ying Zhang:
FPGA-Based Cross-Hardware MBU Emulation Platform for Layout-Level Digital VLSI. 1-6 - Shuo Cai, Jiangbiao Ouyang, Yan Wen, Weizheng Wang, Fei Yu:
A Low-Delay Quadruple-Node-Upset Self-Recoverable Latch Design. 1-5 - Aibin Yan, Xuehua Li, Zhongyu Gao, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen:
Advanced DICE Based Triple-Node-Upset Recovery Latch with Optimized Overhead for Space Applications. 1-5 - Chengzhen Yang, Song Jin, Jianhuang Shen, Zhuo Wang:
On Tolerating Variations and Faults in Memristor Crossbar Based Neural Network Accelerators by Network Expansion and Weight Zeroing. 1-6 - Junna Zhong, Iris Ma, Hailong Li, Yu Huang:
Industry Session II: DFT on AI Chips. 1 - Anshul Jain, Binod Kumar:
A Case Study on Formally Verifying an Open-source Deep Learning Accelerator Design. 1-6 - Nikolaos Ioannis Deligiannis, Tobias Faller, Iacopo Guglielminetti, Riccardo Cantoro, Bernd Becker, Matteo Sonza Reorda:
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors. 1-6 - Mu Nie, Wen Jiang, Wankou Yang, Senling Wang, Xiaoqing Wen, Tianming Ni:
Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through Weakly Supervised Learning. 1-6 - Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui:
Characterization and Test of Intermittent Over RESET in RRAMs. 1-6 - Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero:
Enabling Inter-Product Transfer Learning on MCU Performance Screening. 1-6 - Weiyang He, Zizhen Liu, Chip-Hong Chang:
An Empirical Study of the Inherent Resistance of Knowledge Distillation Based Federated Learning to Targeted Poisoning Attacks. 1-6 - Wen Li, Ying Wang, Kaiwei Zou, Huawei Li, Xiaowei Li:
Adversarial Testing: A Novel On-Line Testing Method for Deep Learning Processors. 1-6 - Jiaxing Gao, Baohua Wang, Yin Zhang, Yu Huang, Xiaotian Ding, Weiming Zhang:
Improve Volume Physical-Aware Diagnosis via Active Pattern Sampling. 1-6 - Han Zhang, Yinhao Zhou, Ying Li:
A Portable Hardware Trojan Detection Using Graph Attention Networks. 1-6 - Ying Shang, Kun Chang, Ruilian Zhao, Zhigang Yin:
Template-Based and Coverage-Guided Verification Instruction Set Automatic Generation Method for DSP Chip. 1-6 - She Tang, Jian Wang, Zhe Chen, Shize Guo:
A Covert Attack Method Against FPGA Clouds. 1-6 - Jianan Mu, Huajie Tan, Shuai Chen, Min Cai, Jing Ye, Huawei Li, Xiaowei Li:
Configurable and High-Level Pipelined Lattice-Based Post Quantum Cryptography Hardware Accelerator Design. 1-6 - Tamaki Kozuma, Qilin Wang, Hideyuki Ichihara, Tomoo Inoue:
Reliability Analysis of Approximate Multipliers with Recovery Schemes. 1-6 - Lirong Zhou, Junjun Wang, Zhao Huang, Lu Fan, Quan Wang, Jinhui Liu, Bo Wan:
A Logic Encryption-Enhanced PUF Architecture to Deceive Machine Learning-Based Modeling Attacks. 1-6 - Gowthami Konganapalle, Sonali Shukla, Virendra Singh:
SMASh: A State Encoding Methodology Against Attacks on Finite State Machines. 1-6 - Aibin Yan, Yu Chen, Zhengfeng Huang, Jie Cui, Xiaoqing Wen:
A High-Performance and P-Type FeFET-Based Non-Volatile Latch. 1-5 - Yipei Yang, Junying Huang, Zongyue Wang, Jing Ye, Zihao Sun, Junfeng Fan, Shuai Chen, Huawei Li, Xiaowei Li, Yuan Cao:
A Template Attack on Reduction Without Reference Device on Kyber. 1-6 - Fan Yang, Tedder Meng, Zhifang Zhang, Yu Huang:
Industry Session I: On Automotive Testing. 1 - Chun-Yeh Wang, Chien-Hsing Liang, Jing-Jia Liou, Harry H. Chen:
Signal Reduction of Signature Blocks for Transient Fault Debugging. 1-6 - Hequan Zhang, Song Jin:
On Detecting and Defending AdvDrop Adversarial Attacks by Image Blurring and Adaptive Noising. 1-6 - Zhaojun Lu, Qi Zhao, Qidong Chen, Jiliang Zhang:
A Survey on Fault-Tolerance Methods for SRAM-Based FPGAs in Radiation Environments. 1-6
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