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Mick Tegethoff
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Journal Articles
- 1997
- [j3]Mick Tegethoff, Tom Chen:
Simulation Techniques for the Manufacturing Test of MCMs. J. Electron. Test. 10(1-2): 137-149 (1997) - 1996
- [j2]Mick Tegethoff, Tom Chen:
Sensitivity Analysis of Critical Parameters in Board Test. IEEE Des. Test Comput. 13(1): 58-63 (1996) - 1995
- [j1]Mick Tegethoff, Kenneth P. Parker:
IEEE Std 1149.1: Where Are We? Where From Here? IEEE Des. Test Comput. 12(2): 53-59 (1995)
Conference and Workshop Papers
- 2006
- [c13]Anis Uzzaman, Mick Tegethoff, Bibo Li, Kevin McCauley, Shuji Hamada, Yasuo Sato:
Not all Delay Tests Are the Same - SDQL Model Shows True-Time. ATS 2006: 147-152 - [c12]Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie:
OCI: Open Compression Interface. ITC 2006: 1-4 - 2004
- [c11]Brion L. Keller, Mick Tegethoff, Thomas Bartenstein, Vivek Chickermane:
An Economic Analysis and ROI Model for Nanometer Test. ITC 2004: 518-524 - 2001
- [c10]Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir:
A new methodology for improved tester utilization. ITC 2001: 916-923 - 1999
- [c9]Von-Kyoung Kim, Tom Chen, Mick Tegethoff:
Fault Coverage Estimation for Early Stage of VLSI Design. Great Lakes Symposium on VLSI 1999: 105-108 - 1997
- [c8]Von-Kyoung Kim, Tom Chen, Mick Tegethoff:
ASIC Manufacturing Test Cost Prediction at Early Design Stage. ITC 1997: 356-361 - 1996
- [c7]Mick Tegethoff, Kenneth P. Parker, Ken Lee:
Opens Board Test Coverage: When is 99% Really 40%? ITC 1996: 333-339 - [c6]Von-Kyoung Kim, Mick Tegethoff, Tom Chen:
ASIC Yield Estimation at Early Design Cycle. ITC 1996: 590-594 - [c5]Felix Frayman, Mick Tegethoff, Brenton White:
Issues in Optimizing the Test Process - A Telecom Case Study. ITC 1996: 800-808 - 1994
- [c4]Mick Tegethoff, Tom Chen:
Defects, Fault Coverage, Yield and Cost in Board Manufacturing. ITC 1994: 539-547 - [c3]Mick Tegethoff, Tom Chen:
Manufacturing-Test Simulator: A Concurrent-Engineering Tool for Boards and MCMs. ITC 1994: 903-910 - 1993
- [c2]Mick Tegethoff:
IEEE 1149.1: How to Justify Implementation. ITC 1993: 265 - 1992
- [c1]Mick Tegethoff, T. E. Figal, S. W. Hird:
Board Test DFT Model for Computer Products. ITC 1992: 367-371
Coauthor Index
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