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2010 – 2019
- 2015
[j8]Carlo De Santi
, Matteo Dal Lago, Matteo Buffolo, Desiree Monti, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni:
Failure causes and mechanisms of retrofit LED lamps. Microelectron. Reliab. 55(9-10): 1765-1769 (2015)- [c2]Carlo De Santi, Matteo Dal Lago, Matteo Buffolo, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni:
Analysis of the mechanisms limiting the reliability of retrofit LED lamps. RTSI 2015: 1-4 - [c1]Nicola Trivellin, Matteo Meneghini, Marco Ferretti, Diego Barbisan, Matteo Dal Lago, Gaudenzio Meneghesso, Enrico Zanoni:
Effects and exploitation of tunable white light for circadian rhythm and human-centric lighting. RTSI 2015: 154-156 - 2014
- [j7]Matteo Meneghini, Simone Vaccari, Matteo Dal Lago, Stefano Marconi, Marco Barbato, Nicola Trivellin, Alessio Griffoni, Alberto Alfier, Giovanni Verzellesi, Gaudenzio Meneghesso, Enrico Zanoni:
ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements. Microelectron. Reliab. 54(6-7): 1143-1149 (2014) - [j6]Matteo Dal Lago, Matteo Meneghini, Carlo De Santi, Marco Barbato, Nicola Trivellin, Gaudenzio Meneghesso, Enrico Zanoni:
ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms. Microelectron. Reliab. 54(9-10): 2138-2141 (2014) - 2013
- [j5]Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni:
"Hot-plugging" of LED modules: Electrical characterization and device degradation. Microelectron. Reliab. 53(9-11): 1524-1528 (2013) - 2012
- [j4]Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni:
Chip and package-related degradation of high power white LEDs. Microelectron. Reliab. 52(5): 804-812 (2012) - [j3]Matteo Meneghini, Matteo Dal Lago, L. Rodighiero, Nicola Trivellin, Enrico Zanoni, Gaudenzio Meneghesso:
Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress. Microelectron. Reliab. 52(8): 1621-1626 (2012) - [j2]Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni:
Phosphors for LED-based light sources: Thermal properties and reliability issues. Microelectron. Reliab. 52(9-10): 2164-2167 (2012) - 2011
- [j1]Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Gaudenzio Meneghesso, Enrico Zanoni:
Degradation mechanisms of high-power white LEDs activated by current and temperature. Microelectron. Reliab. 51(9-11): 1742-1746 (2011)
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