default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDScott Davidson 0001
Person information
- affiliation: Oracle Corp, Santa Clara, CA, USA
- affiliation: AT&T Bell Laboratories, Princeton, NJ, USA
- affiliation (former): Sun Microsystems, Sunnyvale, CA, USA
- affiliation (PhD): University of Louisiana at Lafayette, LA, USA
Other persons with the same name
- Scott Davidson 0002 — ISN Solutions
- Scott Davidson 0003 — Computer Data Systems Inc. (CDSI), Rockville, MD, USA
- Scott Davidson 0004 — University of Washington, Paul G. Allen School of Computer Science & Engineering, Seattle, WA, USA
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
showing all ?? records
Journal Articles
- 2024
[j114]Scott Davidson
:
Losing My Memory. IEEE Des. Test 41(1): 95 (2024)- [j113]Scott Davidson:
Predictions. IEEE Des. Test 41(2): 90 (2024) - [j112]Scott Davidson:
Niklaus Wirth (1934-2024) - An Appreciation. IEEE Des. Test 41(3): 65 (2024) - [j111]Scott Davidson:
IC Phone Home! IEEE Des. Test 41(4): 70 (2024) - [j110]Scott Davidson:
Attack of the AI Papers. IEEE Des. Test 41(5): 95 (2024) - [j109]Scott Davidson:
The Joys of Open-Source Hardware. IEEE Des. Test 41(6): 103 (2024) - 2023
- [j108]Scott Davidson:
Training Data Sets: The Source of Our Woes? IEEE Des. Test 40(1): 116 (2023) - [j107]Scott Davidson:
Is There an Answer? IEEE Des. Test 40(2): 139 (2023) - [j106]Scott Davidson:
Our Gated Community. IEEE Des. Test 40(4): 78 (2023) - [j105]Scott Davidson:
Calling Yourself Back. IEEE Des. Test 40(5): 115 (2023) - 2022
- [j104]Scott Davidson:
25 Years (and a Bit More) of The Last Byte. IEEE Des. Test 39(1): 102 (2022) - [j103]Scott Davidson:
The Memory Shuffle. IEEE Des. Test 39(2): 131 (2022) - [j102]Scott Davidson:
Benchmarking Benchmarking. IEEE Des. Test 39(3): 137 (2022) - [j101]Scott Davidson:
Security Arms Race. IEEE Des. Test 39(4): 94 (2022) - [j100]Scott Davidson:
Standing on the Shoulders of ... IEEE Des. Test 39(5): 98 (2022) - [j99]Scott Davidson:
Small Is Good. IEEE Des. Test 39(6): 180 (2022) - 2021
- [j98]Scott Davidson:
Hacking in the Dark. IEEE Des. Test 38(1): 84 (2021) - [j97]Scott Davidson:
The Road to Open-Source EDA. IEEE Des. Test 38(2): 104 (2021) - [j96]Scott Davidson:
Security Begins at Home. IEEE Des. Test 38(3): 128 (2021) - [j95]Scott Davidson:
Being Learned. IEEE Des. Test 38(4): 136 (2021) - [j94]Scott Davidson:
Bad Design Inside of You. IEEE Des. Test 38(5): 136 (2021) - [j93]Scott Davidson:
Computing in the Real World. IEEE Des. Test 38(6): 100 (2021) - 2020
- [j92]Scott Davidson:
The Last Byte: Big Data, Big Faults. IEEE Des. Test 37(1): 104 (2020) - [j91]Scott Davidson:
The Last Byte: Are You Sure You Love That Store? IEEE Des. Test 37(2): 128 (2020) - [j90]Scott Davidson:
The Last Byte: 3-D TV? We Got 6-D TV! IEEE Des. Test 37(3): 128 (2020) - [j89]Scott Davidson:
My Friendly Orange Glow. IEEE Des. Test 37(4): 112 (2020) - [j88]Scott Davidson:
Transitional Phones. IEEE Des. Test 37(5): 96 (2020) - [j87]Scott Davidson:
Too Many Cooks Make the Product. IEEE Des. Test 37(6): 104 (2020) - 2019
- [j86]Scott Davidson:
Is This a System? IEEE Des. Test 36(1): 72 (2019) - [j85]Scott Davidson:
The Last Byte: I Have Met the IoT Security Enemy and He Is Us. IEEE Des. Test 36(2): 104 (2019) - [j84]Scott Davidson:
The Last Byte: System Testing Ourselves. IEEE Des. Test 36(3): 128 (2019) - [j83]Scott Davidson:
The Last Byte: IoT and That Nagging Feeling. IEEE Des. Test 36(4): 64 (2019) - [j82]Scott Davidson:
The Last Byte: The Internet of People. IEEE Des. Test 36(5): 64 (2019) - 2018
- [j81]Scott Davidson:
Technobabble. IEEE Des. Test 35(1): 104 (2018) - [j80]Scott Davidson:
The Last Byte: Real Time, Real People. IEEE Des. Test 35(2): 109 (2018) - [j79]Scott Davidson:
Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology and Electronic Design Automation for IC System Design, Verification, and Testing. IEEE Des. Test 35(3): 98-99 (2018) - [j78]Scott Davidson:
Computers with Tailfins? IEEE Des. Test 35(3): 104 (2018) - [j77]Scott Davidson:
The Joy of Scheduling. IEEE Des. Test 35(4): 80 (2018) - [j76]Scott Davidson:
Self-Test and Self-Aware. IEEE Des. Test 35(5): 80 (2018) - [j75]Scott Davidson:
Running on Empty. IEEE Des. Test 35(6): 100 (2018) - 2017
- [j74]Scott Davidson:
Research Is Its Own Reward. IEEE Des. Test 34(1): 120 (2017) - [j73]Scott Davidson:
Dark Silicon, Antiparallelism, and Too Much Work. IEEE Des. Test 34(2): 104 (2017) - [j72]Scott Davidson:
Cyber-Physical System Design With Sensor Networking Technologies. IEEE Des. Test 34(3): 105-107 (2017) - [j71]Scott Davidson:
Being Connected. IEEE Des. Test 34(3): 112 (2017) - [j70]Scott Davidson:
Practice Makes Perfect. IEEE Des. Test 34(4): 80 (2017) - [j69]Scott Davidson:
Engineering Secure Internet of Things Systems. IEEE Des. Test 34(5): 97-98 (2017) - [j68]Scott Davidson:
To Verification Infinity and Beyond. IEEE Des. Test 34(5): 104 (2017) - [j67]Scott Davidson:
Chips Thinking About Chips. IEEE Des. Test 34(6): 128 (2017) - 2016
- [j66]Scott Davidson:
Good Enough Computing. IEEE Des. Test 33(1): 96 (2016) - [j65]Scott Davidson:
The Five Stages of Project Grief. IEEE Des. Test 33(2): 104 (2016) - [j64]Scott Davidson:
And He Built a Crooked Chip. IEEE Des. Test 33(3): 144 (2016) - [j63]Scott Davidson:
The Intestinal Superhighway. IEEE Des. Test 33(4): 128 (2016) - [j62]Scott Davidson:
Where Are We Going? IEEE Des. Test 33(5): 104 (2016) - 2015
- [j61]Scott Davidson:
Getting Credit. IEEE Des. Test 32(2): 56 (2015) - [j60]Scott Davidson:
Time Out of Mind. IEEE Des. Test 32(3): 56 (2015) - [j59]Scott Davidson:
A 3-D Forward into the Past. IEEE Des. Test 32(4): 88 (2015) - [j58]Scott Davidson:
Chips That Do Things. IEEE Des. Test 32(6): 112 (2015) - 2014
- [j57]Scott Davidson:
50 Years of DAC Moments. IEEE Des. Test 31(2): 71-72 (2014) - [j56]Scott Davidson:
Hey, you, get onna my cloud [The Last Byte]. IEEE Des. Test 31(3): 95-96 (2014) - [j55]Scott Davidson:
A Truly Wireless Future? IEEE Des. Test 31(6): 56 (2014) - 2013
- [j54]Scott Davidson:
Planned Unobsolescence. IEEE Des. Test 30(6): 104 (2013) - 2012
- [j53]Scott Davidson:
Yield of Black Swans. IEEE Des. Test Comput. 29(1): 80 (2012) - [j52]Scott Davidson:
A World Without Standards. IEEE Des. Test Comput. 29(2): 112 (2012) - [j51]Scott Davidson:
At the beginning. IEEE Des. Test Comput. 29(3): 51 (2012) - [j50]Scott Davidson:
Energy Efficiency Like Your Momma Used to Make. IEEE Des. Test Comput. 29(4): 61 (2012) - 2011
- [j49]Scott Davidson:
All About Liquid Scan Chains - and More [review of "Digital Microfluidic Biochips: Design Automation and Optimization" (Chakrabarty, K. and Xu, T.; 2010)]. IEEE Des. Test Comput. 28(3): 80-81 (2011) - 2010
- [j48]Scott Davidson:
Concurrent checking for logic [review of "New Methods of Concurrent Checking (Goessel, M., et al; 2008)]. IEEE Des. Test Comput. 27(3): 80-81 (2010) - [j47]Scott Davidson:
About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)]. IEEE Des. Test Comput. 27(6): 72-73 (2010) - 2009
- [j46]Scott Davidson:
A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)]. IEEE Des. Test Comput. 26(1): 98-101 (2009) - [j45]Scott Davidson:
Book Review: A book on system test, and testing systems also. IEEE Des. Test Comput. 26(3): 92-93 (2009) - [j44]Scott Davidson:
Book Reviews: A guide for the wrapper perplexed. IEEE Des. Test Comput. 26(6): 98-99 (2009) - [j43]Scott Davidson:
The Last Byte: Too many reboots. IEEE Des. Test Comput. 26(6): 104 (2009) - 2008
- [j42]Scott Davidson:
How to make your own processor architecture. IEEE Des. Test Comput. 25(1): 96-98 (2008) - [j41]Scott Davidson, Nur A. Touba:
Guest Editors' Introduction: Progress in Test Compression. IEEE Des. Test Comput. 25(2): 112-113 (2008) - [j40]Scott Davidson:
The commonality of vector generation techniques. IEEE Des. Test Comput. 25(2): 200 (2008) - [j39]Scott Davidson:
With pick and shovel through our data. IEEE Des. Test Comput. 25(4): 382-383 (2008) - 2007
- [j38]Scott Davidson:
A laboratory right under your nose. IEEE Des. Test Comput. 24(1): 104 (2007) - [j37]Scott Davidson:
A textbook with two target audiences. IEEE Des. Test Comput. 24(2): 198-199 (2007) - [j36]Scott Davidson:
Losing control. IEEE Des. Test Comput. 24(2): 208 (2007) - [j35]Scott Davidson:
How do we train today's students to become tomorrow's engineers? IEEE Des. Test Comput. 24(4): 408 (2007) - [j34]Scott Davidson, Helen Davidson:
The Psychology of Electronic Test. IEEE Des. Test Comput. 24(5): 494-501 (2007) - [j33]Scott Davidson:
Book Reviews: Test Tutorials in Book Form. IEEE Des. Test Comput. 24(5): 506-507 (2007) - 2006
- [j32]Scott Davidson:
Searching for clues: Diagnosing IC failures. IEEE Des. Test Comput. 23(1): 67-68 (2006) - [j31]Scott Davidson:
All about getting it. IEEE Des. Test Comput. 23(1): 80 (2006) - [j30]Scott Davidson:
An insider's look at microprocessor design. IEEE Des. Test Comput. 23(2): 162-163 (2006) - [j29]Scott Davidson:
Who Reads This Stuff Anyway? IEEE Des. Test Comput. 23(4): 328 (2006) - [j28]Scott Davidson:
Book Reviews: A Comprehensive EDA Handbook. IEEE Des. Test Comput. 23(5): 426-427 (2006) - 2005
- [j27]Scott Davidson:
Testing: It's not just pass/fail anymore. IEEE Des. Test Comput. 22(1): 80 (2005) - [j26]Scott Davidson:
BIST the hard way. IEEE Des. Test Comput. 22(4): 386-387 (2005) - [j25]Scott Davidson:
What's the problem? IEEE Des. Test Comput. 22(4): 392 (2005) - [j24]Scott Davidson:
Guest Editor's Introduction: ITC Examines How Test Helps the Fittest Survive. IEEE Des. Test Comput. 22(6): 565 (2005) - 2004
- [j23]Scott Davidson:
Paperless Design and Test. IEEE Des. Test Comput. 21(1): 72- (2004) - [j22]Scott Davidson:
A practical look at ATPG. IEEE Des. Test Comput. 21(5): 448-449 (2004) - [j21]Scott Davidson:
Open-source hardware. IEEE Des. Test Comput. 21(5): 456- (2004) - [j20]Scott Davidson:
Design illiteracy. IEEE Des. Test Comput. 21(6): 608 (2004) - 2003
- [j19]Scott Davidson:
All I Know I Learned at ITC. IEEE Des. Test Comput. 20(5): 104- (2003) - 2001
- [j18]Scott Davidson:
Welcome to 2001. IEEE Des. Test Comput. 18(2): 112- (2001) - 2000
- [j17]Scott Davidson:
Twenty Years Ago Today. IEEE Des. Test Comput. 17(1): 111-112 (2000) - [j16]Scott Davidson, Justin E. Harlow III:
Guest Editors' Introduction: Benchmarking for Design and Test. IEEE Des. Test Comput. 17(3): 12-14 (2000) - [j15]Scott Davidson:
Testing in 2100. IEEE Des. Test Comput. 17(4): 119-120 (2000) - 1999
- [j14]Scott Davidson:
How Do I Boot Thee? Let Me Check Page 3. IEEE Des. Test Comput. 16(2): 96- (1999) - 1998
- [j13]Scott Davidson:
The Newer Colossus. IEEE Des. Test Comput. 15(2): 96- (1998) - [j12]Scott Davidson:
Minutes Found on a Cave Wall. IEEE Des. Test Comput. 15(3): 128- (1998) - [j11]Scott Davidson:
The Last Byte. IEEE Des. Test Comput. 15(4): 96- (1998) - 1997
- [j10]Scott Davidson:
George learns test. IEEE Des. Test Comput. 14(1): 96- (1997) - [j9]Scott Davidson:
Why projects are late. IEEE Des. Test Comput. 14(2): 96- (1997) - 1996
- [j8]Scott Davidson:
Base 1 logic: A method for environmentally friendly PC design. IEEE Des. Test Comput. 13(1): 88- (1996) - [j7]Scott Davidson:
A test puzzle for a TGIF morning. IEEE Des. Test Comput. 13(2): 96- (1996) - [j6]Scott Davidson:
How to achieve 95% fault coverage without really trying. IEEE Des. Test Comput. 13(3): 120- (1996) - 1989
- [j5]Scott Davidson:
Guest Editor's Introduction: Software Tools for Hardware Tests. Computer 22(4): 12-14 (1989) - 1986
- [j4]Scott Davidson:
Progress im High-Level Microprogramming. IEEE Softw. 3(4): 18-26 (1986) - 1981
- [j3]Scott Davidson, David Landskov, Bruce D. Shriver, Patrick W. Mallett:
Some Experiments in Local Microcode Compaction for Horizontal Machines. IEEE Trans. Computers 30(7): 460-477 (1981) - 1980
- [j2]David Landskov, Scott Davidson, Bruce D. Shriver, Patrick W. Mallett:
Local Microcode Compaction Techniques. ACM Comput. Surv. 12(3): 261-294 (1980) - 1978
- [j1]Scott Davidson, Bruce D. Shriver:
An Overview of Firmware Engineering. Computer 11(5): 21-33 (1978)
Conference and Workshop Papers
- 2012
- [c26]Scott Davidson:
Testing high-frequency and low-power designs: Do the standard rules and tools apply? ITC 2012: 1 - 2011
- [c25]Liang-Chi Chen, Peter Dahlgren, Paul Dickinson, Scott Davidson:
Transition test bring-up and diagnosis on UltraSPARCTM processors. ITC 2011: 1-10 - 2009
- [c24]Liang-Chi Chen, Paul Dickinson, Peter Dahlgren, Scott Davidson, Olivier Caty, Kevin Wu:
Using transition test to understand timing behavior of logic circuits on UltraSPARCTM T2 family. ITC 2009: 1-10 - 2008
- [c23]Scott Davidson:
Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model. ITC 2008: 1-10 - 2006
- [c22]Scott Davidson, Anthony P. Ambler, Helen Davidson:
Behavioral Test Economics. ITC 2006: 1-9 - 2005
- [c21]Scott Davidson:
The ITC test compression shootout. ITC 2005: 1 - [c20]Scott Davidson:
Understanding NTF components from the field. ITC 2005: 10 - [c19]Scott Davidson:
Towards an Understanding of No Trouble Found Devices. VTS 2005: 147-152 - 2003
- [c18]Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod:
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. ITC 2003: 998-1007 - 2002
- [c17]Ramesh C. Tekumalla, Scott Davidson:
On Identifying Indistinguishable Path Delay Faults and Improving Diagnosis. ITC 2002: 993-1002 - [c16]Scott Davidson:
What Can IC Test Teach System Test? ITC 2002: 1187 - 2001
- [c15]Magdy S. Abadir, Scott Davidson, Vijay Nagasamy, Dhiraj K. Pradhan, Prab Varma:
ATPG for Design Errors-Is It Possible? VTS 2001: 283-285 - [c14]Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson:
An Evaluation of Pseudo Random Testing for Detecting Real Defects. VTS 2001: 404-410 - 1999
- [c13]Scott Davidson:
Changing our Path to High Level ATPG. ITC 1999: 1114 - [c12]Scott Davidson:
ITC'99 Benchmark Circuits - Preliminary Results. ITC 1999: 1125 - 1998
- [c11]Scott Davidson:
ASIC jeopardy-diagnosing without a FAB. ITC 1998: 1136 - [c10]José M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman:
Test Reuse at System Level. VTS 1998: 318-319 - 1994
- [c9]Scott Davidson:
Is IDDQ Yield Loss Inevitable? ITC 1994: 572-579 - [c8]Suntae Hwang, Rochit Rajsuman, Scott Davidson:
IDDQ Detection of CMOS Bridging Faults by Stuck-At Fault Tests. VLSI Design 1994: 183-186 - 1986
- [c7]Scott Davidson, James L. Lewandowski:
ESIM/AFS : A Concurrent Architectural Level Fault Simulator. ITC 1986: 375-385 - 1985
- [c6]Scott Davidson:
High level design automation tools (session overview). ACM Conference on Computer Science 1985: 73 - 1984
- [c5]Scott Davidson:
Fault Simulation at the Architectural Level. ITC 1984: 669-679 - 1981
- [c4]Scott Davidson, Bruce D. Shriver:
Specifying target resources in a machine independent higher level language. AFIPS National Computer Conference 1981: 81-85 - 1980
- [c3]Bruce D. Shriver, Scott Davidson:
Firmware Engineering - Firmware Engineering. Firmware Engineering 1980: 25-71 - 1976
- [c2]Scott Davidson, William Tao:
Testing of microprograms using the lockheed SUE microinstruction simulator. ANSS 1976: 189-196 - 1975
- [c1]Scott Davidson:
A network of dynamically microprogrammable machines. MICRO (1) 1975: 1-5
Editorship
- 2006
- [e1]Scott Davidson, Anne Gattiker:
2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. IEEE Computer Society 2006, ISBN 1-4244-0292-1 [contents]
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-11-11 21:32 CET by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
