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Brice De Jaeger
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2020 – today
- 2021
- [c3]Eliana Acurio
, Lionel Trojman, Brice De Jaeger, Benoit Bakeroot
, Stefaan Decoutere:
ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric. IRPS 2021: 1-6 - [c2]Elena Fabris
, Matteo Borga
, Niels Posthuma, Ming Zhao, Brice De Jaeger, Shuzhen You, Stefaan Decoutere, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni
:
Vertical stack reliability of GaN-on-Si buffers for low-voltage applications. IRPS 2021: 1-8
2010 – 2019
- 2015
- [c1]Tian-Li Wu
, Denis Marcon, Brice De Jaeger, Marleen Van Hove, Benoit Bakeroot
, Steve Stoffels
, Guido Groeseneken
, Stefaan Decoutere, Robin Roelofs:
Time dependent dielectric breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs. IRPS 2015: 6 - 2014
- [j2]Tian-Li Wu
, Denis Marcon, Steve Stoffels
, Shuzhen You, Brice De Jaeger, Marleen Van Hove, Guido Groeseneken
, Stefaan Decoutere:
Stability evaluation of Au-free Ohmic contacts on AlGaN/GaN HEMTs under a constant current stress. Microelectron. Reliab. 54(9-10): 2232-2236 (2014) - 2011
- [j1]Paolo Magnone
, Felice Crupi, Massimo Alioto, Ben Kaczer, Brice De Jaeger:
Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements. IEEE Trans. Very Large Scale Integr. Syst. 19(9): 1569-1582 (2011)
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last updated on 2024-08-05 20:22 CEST by the dblp team
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