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ORCIDRomain Desplats
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2000 – 2009
- 2006
[j27]Christophe De Nardi, Romain Desplats, Philippe Perdu, Jean-Luc Gauffier, Christophe Guérin:
Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. Microelectron. Reliab. 46(9-11): 1569-1574 (2006)- 2005
- [j26]Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis:
NIR laser stimulation for dynamic timing analysis. Microelectron. Reliab. 45(9-11): 1459-1464 (2005) - [j25]Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit:
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectron. Reliab. 45(9-11): 1476-1481 (2005) - [j24]C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier:
Oxide charge measurements in EEPROM devices. Microelectron. Reliab. 45(9-11): 1514-1519 (2005) - [j23]Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte:
Dynamic Laser Stimulation Case Studies. Microelectron. Reliab. 45(9-11): 1538-1543 (2005) - [j22]Danick Briand
, Felix Beaudoin, Jérôme Courbat, Nico F. de Rooij, Romain Desplats, Philippe Perdu:
Failure analysis of micro-heating elements suspended on thin membranes. Microelectron. Reliab. 45(9-11): 1786-1789 (2005) - 2004
- [j21]Alberto Tosi, Mustapha Remmach, Romain Desplats, Franco Zappa, Philippe Perdu:
Implementation of TRE systems into Emission Microscopes. Microelectron. Reliab. 44(9-11): 1529-1534 (2004) - [j20]D. Martin, Romain Desplats, Gérald Haller, Pascal Nouet, Florence Azaïs:
Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. Microelectron. Reliab. 44(9-11): 1553-1558 (2004) - [j19]Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti:
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. Microelectron. Reliab. 44(9-11): 1559-1563 (2004) - [j18]Felix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu:
Femtosecond Laser Ablation for Backside Silicon Thinning. Microelectron. Reliab. 44(9-11): 1605-1609 (2004) - [j17]Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis:
Time Resolved Photon Emission Processing Flow for IC Analysis. Microelectron. Reliab. 44(9-11): 1655-1662 (2004) - [j16]Romain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis:
Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections. Microelectron. Reliab. 44(9-11): 1709-1714 (2004) - [j15]Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis:
Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? Microelectron. Reliab. 44(9-11): 1715-1720 (2004) - 2003
- [j14]Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles:
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43(3): 439-444 (2003) - [j13]Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis:
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectron. Reliab. 43(9-11): 1639-1644 (2003) - [j12]Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari:
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectron. Reliab. 43(9-11): 1663-1668 (2003) - [j11]Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis:
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. 43(9-11): 1681-1686 (2003) - [j10]Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu:
Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectron. Reliab. 43(9-11): 1755-1760 (2003) - [j9]Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina:
Magnetic emission mapping for passive integrated components characterisation. Microelectron. Reliab. 43(9-11): 1809-1814 (2003) - [c1]Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah:
Fault Localization using Time Resolved Photon Emission and STIL Waveforms. ITC 2003: 254-263 - 2002
- [j8]Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement:
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectron. Reliab. 42(9-11): 1581-1585 (2002) - [j7]Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis:
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectron. Reliab. 42(9-11): 1729-1734 (2002) - [j6]Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis:
Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectron. Reliab. 42(9-11): 1741-1746 (2002) - [j5]Djemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats:
IR confocal laser microscopy for MEMS Technological Evaluation. Microelectron. Reliab. 42(9-11): 1815-1817 (2002) - 2001
- [j4]Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis:
Modeling Thermal Laser Stimulation. Microelectron. Reliab. 41(9-10): 1477-1482 (2001) - [j3]Romain Desplats, Philippe Perdu, Felix Beaudoin:
A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. Microelectron. Reliab. 41(9-10): 1495-1499 (2001) - [j2]Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis:
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectron. Reliab. 41(9-10): 1539-1544 (2001) - [j1]Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis:
Silicon Thinning and Polishing on Packaged Devices. Microelectron. Reliab. 41(9-10): 1557-1561 (2001)
Coauthor Index
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