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Aldo Ghisi
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2020 – today
- 2022
- [j10]Pooyan Kazemi
, Aldo Ghisi
, Stefano Mariani
:
Classification of the Structural Behavior of Tall Buildings with a Diagrid Structure: A Machine Learning-Based Approach. Algorithms 15(10): 349 (2022)
2010 – 2019
- 2019
- [j9]Aldo Ghisi
, Stefano Mariani
:
Effect of Imperfections Due to Material Heterogeneity on the Offset of Polysilicon MEMS Structures. Sensors 19(15): 3256 (2019) - 2014
- [j8]Aldo Ghisi
, Stefano Mariani
, Alberto Corigliano
, Giorgio Allegato, Laura Oggioni:
A three-scale approach to the numerical simulation of metallic bonding for MEMS packaging. Microelectron. Reliab. 54(9-10): 2039-2043 (2014) - 2013
- [j7]Federica Confalonieri
, Giuseppe Cocchetti
, Aldo Ghisi
, Alberto Corigliano
:
A domain decomposition method for the simulation of fracture in polysilicon MEMS. Microelectron. Reliab. 53(8): 1045-1054 (2013) - 2012
- [j6]Aldo Ghisi
, Stefano Mariani
, Alberto Corigliano, Sarah Zerbini:
Physically-Based Reduced Order Modelling of a Uni-Axial Polysilicon MEMS Accelerometer. Sensors 12(10): 13985-14003 (2012) - 2011
- [j5]Stefano Mariani
, Aldo Ghisi
, Alberto Corigliano, Roberto Martini, Barbara Simoni:
Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors. Sensors 11(5): 4972-4989 (2011)
2000 – 2009
- 2009
- [j4]Stefano Mariani
, Roberto Martini, Aldo Ghisi
:
A Finite Element Flux-Corrected Transport Method for Wave Propagation in Heterogeneous Solids. Algorithms 2(1): 1-18 (2009) - [j3]Giacomo Langfelder
, Antonio Longoni, Federico Zaraga, Alberto Corigliano
, Aldo Ghisi
, A. Merassi:
A new on-chip test structure for real time fatigue analysis in polysilicon MEMS. Microelectron. Reliab. 49(2): 120-126 (2009) - [j2]Aldo Ghisi
, Fabio Fachin, Stefano Mariani
, Sarah Zerbini:
Multi-scale analysis of polysilicon MEMS sensors subject to accidental drops: Effect of packaging. Microelectron. Reliab. 49(3): 340-349 (2009) - [j1]Stefano Mariani
, Aldo Ghisi
, Alberto Corigliano, Sarah Zerbini:
Modeling Impact-induced Failure of Polysilicon MEMS: A Multi-scale Approach. Sensors 9(1): 556-567 (2009)
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