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Journal Articles
- 2023
[j17]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. J. Electron. Test. 39(2): 155-170 (2023)- 2021
- [j16]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. J. Electron. Test. 37(2): 225-242 (2021) - 2020
- [j15]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. J. Electron. Test. 36(2): 189-203 (2020) - 2019
- [j14]Mohan Julien, Serge Bernard
, Fabien Soulier, Vincent Kerzèrho, Guy Cathébras:
Breaking the speed-power-accuracy trade-off in current mirror with non-linear CCII feedback. Microelectron. J. 83: 77-85 (2019) - [j13]Fabien Soulier, Achraf Lamlih, Vincent Kerzerho, Serge Bernard, Tristan Rouyer:
Very Low Resource Digital Implementation of Bioimpedance Analysis. Sensors 19(15): 3381 (2019) - 2018
- [j12]Stephane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzerho, Florence Azaïs, Fabien Soulier, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard:
On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints. J. Electron. Test. 34(3): 281-290 (2018) - 2017
- [j11]Anthony Deluthault, Vincent Kerzerho, Serge Bernard, Fabien Soulier, Philippe Cauvet:
New Calibration Technique of Contact-less Resonant Biosensor. J. Electron. Test. 33(3): 365-375 (2017) - [j10]Anthony Deluthault, Luc Mezenge, Philippe Cauvet, Vincent Kerzerho, Fabien Soulier, Serge Bernard:
Efficient Objective Metric Tool for Medical Electrical Device Development: Eye Phantom for Glaucoma Diagnosis Device. J. Sensors 2017: 8436123:1-8436123:9 (2017) - 2015
- [j9]Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. Microelectron. J. 46(11): 1091-1102 (2015) - 2014
- [j8]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements. Microelectron. J. 45(3): 336-344 (2014) - 2013
- [j7]Vincent Kerzerho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Chuan Shan, G. Bontorin, Michel Renovell:
A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC. Microelectron. J. 44(9): 840-843 (2013) - 2011
- [j6]Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell:
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electron. Test. 27(3): 335-350 (2011) - [j5]Vincent Kerzerho, Vincent Fresnaud, Dominique Dallet, Serge Bernard, Lilian Bossuet:
Fast Digital Post-Processing Technique for Integral Nonlinearity Correction of Analog-to-Digital Converters: Validation on a 12-Bit Folding-and-Interpolating Analog-to-Digital Converter. IEEE Trans. Instrum. Meas. 60(3): 768-775 (2011) - 2008
- [j4]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib:
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008: 482159:1-482159:8 (2008) - 2007
- [j3]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Comput. Digit. Tech. 1(3): 146-153 (2007) - 2006
- [j2]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Des. Test Comput. 23(3): 234-243 (2006) - [j1]Vincent Kerzerho, Serge Bernard, Philippe Cauvet, Jean-Marie Janik:
A First Step for an INL Spectral-Based BIST: The Memory Optimization. J. Electron. Test. 22(4-6): 351-357 (2006)
Conference and Workshop Papers
- 2024
- [c26]Stéphane Pitou, Florence Azaïs, Serge Bernard, Tristan Rouyer, Fabien Soulier, Vincent Kerzerho:
Low-Resource Fully-Digital BPSK Demodulation Technique for Intra-Body Wireless Sensor Networks. I2MTC 2024: 1-6 - 2023
- [c25]Stéphane Pitou, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard, Fabien Soulier, Vincent Kerzerho:
First Step Towards a Fully-Miniaturized Intra-body Communication Transceiver Based on Galvanic Coupling. FICC (1) 2023: 107-119 - 2021
- [c24]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, François Lefèvre:
Exploring on-line RF performance monitoring based on the indirect test strategy. LATS 2021: 1-7 - 2020
- [c23]Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel:
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS 2020: 1-4 - [c22]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot:
Implementing indirect test of RF circuits without compromising test quality: a practical case study. LATS 2020: 1-6 - 2019
- [c21]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Use of ensemble methods for indirect test of RF circuits: can it bring benefits? LATS 2019: 1-6 - [c20]Hassan El Badawi, Mariane Comte, Florence Azaïs, Vincent Kerzèrho, Serge Bernard, François Lefevre:
Which metrics to use for RF indirect test strategy? SMACD 2019: 73-76 - 2018
- [c19]Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzerho, Guy Cathébras:
Improvement of Active-Input Current Mirrors Using Adaptive Biasing Technique. DCIS 2018: 1-4 - [c18]Fabien Soulier, Achraf Lamlih, Vincent Kerzerho, Serge Bernard:
A Multitone Analysis for Bioimpedance Spectroscopy using Minimal Digital Ressource. ICST 2018: 315-318 - [c17]Achraf Lamlih, Philippe Freitas, Stephane David-Grignot, Jérémie Salles, Vincent Kerzèrho, Fabien Soulier, Serge Bernard, Tristan Rouyer, Sylvain Bonhommeau:
Wideband Fully Differential Current Driver with Optimized Output Impedance for Bioimpedance Measurements. ISCAS 2018: 1-5 - [c16]Achraf Lamlih, Philippe Freitas, Mohamed Moez Belhaj, Jérémie Salles, Vincent Kerzerho, Fabien Soulier, Serge Bernard, Tristan Rouyer, Sylvain Bonhommeau:
A Hybrid Bioimpedance Spectroscopy Architecture for a Wide Frequency Exploration of Tissue Electrical Properties. VLSI-SoC 2018: 168-171 - 2017
- [c15]Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzerho, Guy Cathébras:
Formal analysis of bandwidth enhancement for high-performance active-input current mirror. DTIS 2017: 1-6 - [c14]Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzerho, Guy Cathébras:
Formal analysis of high-performance stabilized active-input current mirror. ISCAS 2017: 1-4 - 2015
- [c13]Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy. ISVLSI 2015: 621-626 - [c12]Vincent Kerzerho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge Bernard:
Toward Adaptation of ADCs to Operating Conditions through On-chip Correction. ISVLSI 2015: 634-639 - 2014
- [c11]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
New implementions of predictive alternate analog/RF test with augmented model redundancy. DATE 2014: 1-4 - [c10]Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos:
Solutions for the self-adaptation of communicating systems in operation. IOLTS 2014: 234-239 - [c9]Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzerho, Mariane Comte, Michel Renovell:
Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. LATW 2014: 1-6 - 2013
- [c8]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell:
Implementing model redundancy in predictive alternate test to improve test confidence. ETS 2013: 1 - [c7]Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzerho, Florence Azaïs, Michel Renovell, Thibault Kervaon, Paul-Henri Pugliesi-Conti:
Accurate and efficient analytical electrical model of antenna for NFC applications. NEWCAS 2013: 1-4 - 2012
- [c6]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell:
Making predictive analog/RF alternate test strategy independent of training set size. ITC 2012: 1-9 - [c5]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma:
Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS 2012: 19-24 - 2010
- [c4]Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff:
Predicting dynamic specifications of ADCs with a low-quality digital input signal. ETS 2010: 158-163 - 2009
- [c3]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
A multi-converter DFT technique for complex SIP: Concepts and validation. ECCTD 2009: 747-750 - 2007
- [c2]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS 2007: 211-216 - 2006
- [c1]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS 2006: 159-164
Coauthor Index
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