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Pascal Fouillat
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Journal Articles
- 2009
- [j15]Timothée Levi, Jean Tomas, Noëlle Lewis, Pascal Fouillat:
A CMOS Resizing Methodology for Analog Circuits. IEEE Des. Test Comput. 26(1): 78-87 (2009) - 2008
- [j14]Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely:
Effect of physical defect on shmoos in CMOS DSM technologies. Microelectron. Reliab. 48(8-9): 1333-1338 (2008) - 2006
- [j13]Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat:
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectron. Reliab. 46(9-11): 1514-1519 (2006) - 2005
- [j12]Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat:
Impact of semiconductors material on IR Laser Stimulation signal. Microelectron. Reliab. 45(9-11): 1465-1470 (2005) - 2004
- [j11]Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat:
Understanding the effects of NIR laser stimulation on NMOS transistor. Microelectron. Reliab. 44(9-11): 1675-1680 (2004) - [j10]Romain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis:
Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections. Microelectron. Reliab. 44(9-11): 1709-1714 (2004) - [j9]Vincent Pouget, Dean Lewis, Pascal Fouillat:
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. IEEE Trans. Instrum. Meas. 53(4): 1227-1231 (2004) - 2003
- [j8]Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto:
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43(1): 173-177 (2003) - [j7]Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles:
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43(3): 439-444 (2003) - [j6]Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat:
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectron. Reliab. 43(9-11): 1577-1582 (2003) - [j5]Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière:
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectron. Reliab. 43(9-11): 1615-1619 (2003) - 2002
- [j4]Anne Spataro, Yann Deval, Jean-Baptiste Bégueret, Pascal Fouillat:
A VLSI CMOS delay oriented waveform converter for polyphase frequency synthesizer. IEEE J. Solid State Circuits 37(3): 336-341 (2002) - 2001
- [j3]Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu:
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. 41(9-10): 1471-1476 (2001) - [j2]Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner:
Theoretical Investigation of an Equivalent Laser LET. Microelectron. Reliab. 41(9-10): 1513-1518 (2001) - 1999
- [j1]Yvan Maiden, Barrie W. Jervis, Pascal Fouillat, S. Lesage:
Using artificial neural networks or Lagrange interpolation to characterize the faults in an analog circuit: an experimental study. IEEE Trans. Instrum. Meas. 48(5): 932-938 (1999)
Conference and Workshop Papers
- 2008
- [c16]Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco:
Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. IOLTS 2008: 295-301 - 2005
- [c15]Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu:
Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS 2005: 9-13 - 2002
- [c14]David Deschans, Jean-Baptiste Bégueret, Yann Deval, Christophe Scarabello, Pascal Fouillat, Guy Montignac, Alain Baudry:
A SiGe 4-Gsps 2-bits digitizer with 2-4 GHz input bandwidth. ICECS 2002: 1-4 - [c13]Dean Lewis, Pascal Fouillat, Vincent Pouget:
Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser. LATW 2002: 109-113 - [c12]Pascal Fouillat:
Laser Utilization for Various Testing Purposes. LATW 2002: 130 - [c11]David Deschans, Jean-Baptiste Bégueret, Yann Deval, Christophe Scarabello, Pascal Fouillat, Guy Montignac, Alain Baudry:
A 4 Gsamples/S with 2-4 GHz Input Bandwidth SIGE Digitizer for Radio Astronomy Applications. SBCCI 2002: 350-358 - 2001
- [c10]Anne Spataro, Yann Deval, Jean-Baptiste Bigueret, Pascal Fouillat, Didier Belot:
A CMOS VLSI delay oriented waveform converter dedicated to the synthesizer of an UMTS transceiver. CICC 2001: 217-220 - [c9]Jean-Baptiste Bégueret, Yann Deval, Olivier Mazouffre, Anne Spataro, Pascal Fouillat, Eric Benoit, Jean Mendoza:
Clock generator using factorial DLL for video applications. CICC 2001: 485-488 - [c8]L. Camino, Serge Ramet, Jean-Baptiste Bégueret, Yann Deval, Pascal Fouillat:
Phase error determination in GMSK modulated fractional-N PLL. ICECS 2001: 47-50 - [c7]Dean Lewis, Hervé Lapuyade, Yann Deval, Yvan Maidon, Frédéric Darracq, Renaud Briand, Pascal Fouillat:
A New Laser System for X-Rays Flashes Sensitivity Evaluation. IOLTW 2001: 111- - 2000
- [c6]Anne Spataro, Yann Deval, Jean-Baptiste Bégueret, Pascal Fouillat:
Delay oriented design methodology: application to the design of a VHF low power VLSI polyphase oscillator. ICECS 2000: 248-251 - [c5]Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet:
An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW 2000: 52- - [c4]Yann Deval, Jean-Baptiste Bégueret, Jean Tomas, Pascal Fouillat:
Toward Analog Circuit Synthesis: A Global Methodology Based upon Design of Experiments. SBCCI 2000: 295-300 - 1999
- [c3]Jean Tomas, Yann Deval, Jean-Baptiste Bégueret, Pascal Fouillat, J. L. Aucouturier:
A New Industrial Approach Compatible With Microelectronics Education: Application to an RF System Design. MSE 1999: 37-38 - [c2]Thomas Zimmer, Noëlle Milet-Lewis, Ahmed Fakhfakh, B. Ardouin, Hervé Levi, J. B. Duluc, Pascal Fouillat:
Hierarchical Analogue Design and Behavioural Modelling. MSE 1999: 59-60 - 1997
- [c1]Jean Tomas, Yann Deval, Pascal Fouillat, E. Ragbi, Jean Paul Dom, J. L. Aucouturier:
Design, integration and characterization of analog integrated circuits: a complete design flow dedicated to microelectronics education. MSE 1997: 75-76
Coauthor Index
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