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ORCIDPeter Muhmenthaler
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2000 – 2009
- 2006
[c11]Peter Muhmenthaler:
New on-Chip DFT and ATE Features for Efficient Embedded Memory Test. MTDT 2006- [c10]Ajay Khoche, Peter Muhmenthaler:
Session Abstract. VTS 2006: 288-289 - 2005
- [c9]Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai:
Compression mode diagnosis enables high volume monitoring diagnosis flow. ITC 2005: 10 - 2004
- [c8]Andreas Leininger, Michael Gössel, Peter Muhmenthaler:
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. DATE 2004: 1302-1309 - 2003
- [c7]Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski:
Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. ITC 2003: 1211-1220 - 2002
- [c6]Peter Muhmenthaler:
Outsourcing Test without Standards? ITC 2002: 1217-1218 - 2001
- [c5]Yervant Zorian, Paolo Prinetto, João Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher:
Embedded tutorial: TRP: integrating embedded test and ATE. DATE 2001: 34-37 - 2000
- [c4]Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf:
Tutorial Statement. DATE 2000: 66
1990 – 1999
- 1999
- [c3]Peter Muhmenthaler:
Cost effective testing of systems on silicon: areas for optimization. ETW 1999: 142-143 - 1991
- [c2]H.-D. Oberle, Peter Muhmenthaler:
Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM. ITC 1991: 548-555 - [c1]H.-D. Oberle, M. Maue, Peter Muhmenthaler:
Enhanced fault modeling for DRAM test and analysis. VTS 1991: 149-154
Coauthor Index
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