- Silvia Franchini, Antonio Gentile, Filippo Sorbello, Giorgio Vassallo, Salvatore Vitabile:
Design Space Exploration of Parallel Embedded Architectures for Native Clifford Algebra Operations. IEEE Des. Test Comput. 29(3): 60-69 (2012) - Anne E. Gattiker, Phil Nigh:
Guest Editors' Introduction: Yield Learning Processes and Methods. IEEE Des. Test Comput. 29(1): 6-7 (2012) - Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection. IEEE Des. Test 29(6): 66-73 (2012) - P. Glenn Gulak, Rajesh Gupta, Gianluca Setti, Yervant Zorian:
Message From the Steering Committee. IEEE Des. Test Comput. 29(1): 5 (2012) - Mark Hahn:
OpenAccess: Standard and Practices. IEEE Des. Test Comput. 29(2): 44-52 (2012) - Masahiro Ishida, Kiyotaka Ichiyama, Tasuku Fujibe, Daisuke Watanabe, Masayuki Kawabata:
Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost. IEEE Des. Test Comput. 29(5): 63-71 (2012) - Michael Jassowski:
Organizational Dynamics: Understanding the Impact of Organizational Structure in Team Productivity. IEEE Des. Test Comput. 29(3): 52-59 (2012) - Hua Jiang, Marc D. Riedel, Keshab K. Parhi:
Digital Signal Processing With Molecular Reactions. IEEE Des. Test Comput. 29(3): 21-31 (2012) - Andrew B. Kahng:
Predicting the future of information technology and society [The Road Ahead]. IEEE Des. Test Comput. 29(6): 101-102 (2012) - M. Kamm, H. Jun, L. Boluna:
SerDes Interoperability and Optimization. IEEE Des. Test Comput. 29(5): 47-53 (2012) - John Keane, Chris H. Kim, Qunzeng Liu, Sachin S. Sapatnekar:
Process and Reliability Sensors for Nanoscale CMOS. IEEE Des. Test Comput. 29(5): 8-17 (2012) - Stan Krolikoski:
Patents in the IEEE Standards Process. IEEE Des. Test Comput. 29(1): 68-71 (2012) - Stan Krolikoski:
That's not our job! [Standards]. IEEE Des. Test Comput. 29(3): 90-92 (2012) - Stan Krolikoski:
Two Approaches to Handling Late Essential/Necessary Patent Claims Against Standards. IEEE Des. Test Comput. 29(5): 102-104 (2012) - Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing:
Defect Oriented Testing for Analog/Mixed-Signal Designs. IEEE Des. Test Comput. 29(5): 72-80 (2012) - Nathan Kupp, Yiorgos Makris:
Applying the Model-View-Controller Paradigm to Adaptive Test. IEEE Des. Test Comput. 29(1): 28-35 (2012) - Mehdi Maasoumy, Alberto L. Sangiovanni-Vincentelli:
Total and Peak Energy Consumption Minimization of Building HVAC Systems Using Model Predictive Control. IEEE Des. Test Comput. 29(4): 26-35 (2012) - Curtis Madsen, Chris J. Myers, Tyler Patterson, Nicholas Roehner, Jason T. Stevens, Chris Winstead:
Design and Test of Genetic Circuits Using ${\tt iBioSim}$iBioSim. IEEE Des. Test Comput. 29(3): 32-39 (2012) - Erik Jan Marinissen:
Pioneering in Asia With the US Venture Capital Model. IEEE Des. Test Comput. 29(6): 52-55 (2012) - Christopher Maxey, Sanjay Raman, Kari Groves, Tony Quach, Pompei L. Orlando, Aji Mattamana, Gregory L. Creech, Jay Rockway:
Mixed-Signal SoCs With In Situ Self-Healing Circuitry. IEEE Des. Test 29(6): 27-39 (2012) - Rich Morse:
Interoperable Design Constraints for Custom IC Design. IEEE Des. Test Comput. 29(2): 53-61 (2012) - Rashmi Nanda, Dejan Markovic:
Digitally intensive receiver design: opportunities and challenges. IEEE Des. Test 29(6): 19-26 (2012) - Seetharam Narasimhan, Rajat Subhra Chakraborty, Swarup Chakraborty:
Hardware IP Protection During Evaluation Using Embedded Sequential Trojan. IEEE Des. Test Comput. 29(3): 70-79 (2012) - Seetharam Narasimhan, Wen Yueh, Xinmu Wang, Saibal Mukhopadhyay, Swarup Bhunia:
Improving IC Security Against Trojan Attacks Through Integration of Security Monitors. IEEE Des. Test Comput. 29(5): 37-46 (2012) - Michael Nicolaidis:
Biologically Inspired Robust Tera-Device Processors. IEEE Des. Test 29(5): 94-99 (2012) - Jackson Pachito, Celestino V. Martins, Bruno Jacinto, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Aging-Aware Power or Frequency Tuning With Predictive Fault Detection. IEEE Des. Test Comput. 29(5): 27-36 (2012) - Partha Pande:
Test Technology TC Newsletter. IEEE Des. Test Comput. 29(1): 76-77 (2012) - Partha Pande:
Test Technology TC Newsletter. IEEE Des. Test Comput. 29(2): 107-108 (2012) - Partha Pande:
Test Technology TC Newsletter. IEEE Des. Test Comput. 29(4): 103-104 (2012) - Mary Ann Piette, Jessica Granderson, Michael Wetter, Sila Kiliccote:
Intelligent Building Energy Information and Control Systems for Low-Energy Operations and Optimal Demand Response. IEEE Des. Test Comput. 29(4): 8-16 (2012)