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Publication search results
found 46 matches
- 2020
- Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux:
Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models. IOLTS 2020: 1-6 - Chandramouli N. Amarnath, Md Imran Momtaz, Abhijit Chatterjee:
Encoded Check Driven Concurrent Error Detection in Particle Filters for Nonlinear State Estimation. IOLTS 2020: 1-6 - Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel:
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS 2020: 1-4 - Sarah Azimi, Corrado De Sio, Luca Sterpone:
In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops. IOLTS 2020: 1-6 - Ahmet Cagri Bagbaba, Maksim Jenihhin, Raimund Ubar, Christian Sauer:
Representing Gate-Level SET Faults by Multiple SEU Faults at RTL. IOLTS 2020: 1-6 - Leila Bagheriye, Ghazanfar Ali, Hans G. Kerkhoff:
Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. IOLTS 2020: 1-4 - Cristiana Bolchini, Luca Cassano, Andrea Mazzeo, Antonio Miele:
Error Modeling for Image Processing Filters accelerated onto SRAM-based FPGAs. IOLTS 2020: 1-6 - Josie E. Rodriguez Condia, Matteo Sonza Reorda:
On the testing of special memories in GPGPUs. IOLTS 2020: 1-6 - Sarah A. El-Sayed, Theofilos Spyrou, Antonios Pavlidis, Engin Afacan, Luis A. Camuñas-Mesa, Bernabé Linares-Barranco, Haralampos-G. D. Stratigopoulos:
Spiking Neuron Hardware-Level Fault Modeling. IOLTS 2020: 1-4 - Homer Gamil, Pranav Mehta, Eduardo Chielle, Adriano Di Giovanni, Mohammed Nabeel, Francesco Arneodo, Michail Maniatakos:
Muon-Ra: Quantum random number generation from cosmic rays. IOLTS 2020: 1-6 - Kathrin Garb, Johannes Obermaier:
Temporary Laser Fault Injection into Flash Memory: Calibration, Enhanced Attacks, and Countermeasures. IOLTS 2020: 1-7 - Vishal Gupta, Saurabh Khandelwal, Giulio Panunzi, Eugenio Martinelli, Said Hamdioui, Abusaleh M. Jabir, Marco Ottavi:
Yield Estimation of a Memristive Sensor Array. IOLTS 2020: 1-2 - Muhammad Abdullah Hanif, Muhammad Shafique:
Dependable Deep Learning: Towards Cost-Efficient Resilience of Deep Neural Network Accelerators against Soft Errors and Permanent Faults. IOLTS 2020: 1-4 - Toshinori Hosokawa, Kenichiro Misawa, Hiroshi Yamazaki, Masayoshi Yoshimura, Masayuki Arai:
A Low Capture Power Oriented X-Identification-Filling Co-Optimization Method. IOLTS 2020: 1-4 - Yuki Ikegaya, Toshinori Hosokawa, Yuta Ishiyama, Hiroshi Yamazaki:
A Test Sensitization State Compaction Method on Controller Augmentation. IOLTS 2020: 1-6 - Abhishek Jain, Andrea Veggetti, Dennis Crippa, Antonio Benfante, Simone Gerardin, Marta Bagatin:
Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit. IOLTS 2020: 1-6 - Zahra Kazemi, Mahdi Fazeli, David Hély, Vincent Beroulle:
Hardware Security Vulnerability Assessment to Identify the Potential Risks in A Critical Embedded Application. IOLTS 2020: 1-6 - Shamik Kundu, Ahmet Soyyigit, Khaza Anuarul Hoque, Kanad Basu:
High-level Modeling of Manufacturing Faults in Deep Neural Network Accelerators. IOLTS 2020: 1-4 - Tatsuki Kurihara, Kento Hasegawa, Nozomu Togawa:
Evaluation on Hardware-Trojan Detection at Gate-Level IP Cores Utilizing Machine Learning Methods. IOLTS 2020: 1-4 - Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone:
Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. IOLTS 2020: 1-7 - Ana Lasheras, Ramon Canal, Eva Rodríguez, Luca Cassano:
Lightweight Protection of Cryptographic Hardware Accelerators against Differential Fault Analysis. IOLTS 2020: 1-6 - João Paulo Cardoso de Lima, Rafael Fão de Moura, Luigi Carro:
Leveraging reuse and endurance by efficient mapping and placement for NVM-based FPGAs. IOLTS 2020: 1-6 - Yufan Lu, Xiaojun Zhai, Sangeet Saha, Shoaib Ehsan, Klaus D. McDonald-Maier:
A self-scrubbing scheme for embedded systems in radiation environments. IOLTS 2020: 1-4 - Antonio Leonel Hernández Martínez, S. Saqib Khursheed, Daniele Rossi:
Leveraging CMOS Aging for Efficient Microelectronics Design. IOLTS 2020: 1-4 - Tommaso Melis, Emmanuel Simeu, Etienne Auvray:
Automatic Fault Simulators for Diagnosis of Analog Systems. IOLTS 2020: 1-6 - Yukiya Miura, Yuya Kinoshita:
Soft Error Tolerance of Power-Supply-Noise Hardened Latches. IOLTS 2020: 1-6 - Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yukiya Miura:
On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test. IOLTS 2020: 1-6 - Christopher Münch, Mehdi B. Tahoori:
Defect Characterization of Spintronic-based Neuromorphic Circuits. IOLTS 2020: 1-4 - Quang-Linh Nguyen, Emanuele Valea, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre:
A Secure Scan Controller for Protecting Logic Locking. IOLTS 2020: 1-6 - Panagiota Papavramidou, Michael Nicolaidis, Patrick Girard:
An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM. IOLTS 2020: 1-6
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