ISQED 2012: Santa Clara, California, USA

Test and Measurement

Reliable System Design

System Frameworks and Tools

Thermal and Power in 3D ICs

Low Power Communication Circuits

Process-Induced Variability & Hot Spot Detection

Emerging Topics in EDA

Design & Analysis of Emerging Devices

Variation-Aware Design Methodologies

Poster Session

Physical Design

Robust SRAM Design

3D Effects on Package Co-Design

Advanced Analysis & Characterization for Sub-Micron Design

Power-Aware Design

Circuit-Level Variability & Manufacturability

Verification & Silicon Debug

Challenges & Opportunities in New Technologies

Energy-Aware System Design

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