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Journal Articles
- 2021
[j16]Alexandre Boyer
, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia:
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. IEEE Trans. Instrum. Meas. 70: 1-15 (2021)- 2015
- [j15]He Huang, Alexandre Boyer, Sonia Ben Dhia:
Electronic counterfeit detection based on the measurement of electromagnetic fingerprint. Microelectron. Reliab. 55(9-10): 2050-2054 (2015) - [j14]He Huang, Alexandre Boyer, Sonia Bendhia:
Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter. Microelectron. Reliab. 55(9-10): 2061-2066 (2015) - 2014
- [j13]Alexandre Boyer, Sonia Ben Dhia:
Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits. J. Low Power Electron. 10(1): 165-172 (2014) - 2013
- [j12]Sonia Ben Dhia, Alexandre Boyer:
Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project. Microelectron. Reliab. 53(9-11): 1266-1272 (2013) - [j11]Jianfei Wu, Alexandre Boyer, Jiancheng Li, Sonia Bendhia, Bertrand Vrignon:
LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing. Microelectron. Reliab. 53(9-11): 1273-1277 (2013) - 2012
- [j10]Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro:
IC Immunity Modeling Process Validation Using On-Chip Measurements. J. Electron. Test. 28(3): 339-348 (2012) - [j9]Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon:
Prediction of Long-term Immunity of a Phase-Locked Loop. J. Electron. Test. 28(6): 791-802 (2012) - [j8]Sonia Bendhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro, Thanh Vinh Dinh:
On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations. IEEE Trans. Instrum. Meas. 61(3): 696-707 (2012) - 2011
- [j7]Raúl Fernández-García, Ignacio Gil, Alexandre Boyer, Sonia Bendhia, Bertrand Vrignon:
A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior. IEICE Trans. Electron. 94-C(12): 1906-1908 (2011) - [j6]Binhong Li, Néstor Berbel, Alexandre Boyer, Sonia Bendhia, Raúl Fernández-García:
Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. Microelectron. Reliab. 51(9-11): 1557-1560 (2011) - [j5]Néstor Berbel, Raúl Fernández-García, Ignacio Gil, Binhong Li, Alexandre Boyer, Sonia Bendhia:
Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout. Microelectron. Reliab. 51(9-11): 1564-1567 (2011) - 2010
- [j4]Binhong Li, Alexandre Boyer, Sonia Bendhia, Christophe Lemoine:
Ageing effect on electromagnetic susceptibility of a phase locked loop. Microelectron. Reliab. 50(9-11): 1304-1308 (2010) - [j3]Syed Mahfuzul Aziz, Etienne Sicard, Sonia Ben Dhia:
Effective Teaching of the Physical Design of Integrated Circuits Using Educational Tools. IEEE Trans. Educ. 53(4): 517-531 (2010) - 2004
- [j2]C. Lochot, S. Calvet, Sonia Ben Dhia, Etienne Sicard:
REGINA test mask: research on EMC guidelines for integrated automotive circuits. Microelectron. J. 35(6): 509-523 (2004) - 2001
- [j1]Fabrice Caignet, Sonia Delmas-Bendhia, Etienne Sicard:
The challenge of signal integrity in deep-submicrometer CMOS technology. Proc. IEEE 89(4): 556-573 (2001)
Conference and Workshop Papers
- 2015
- [c7]Veljko Tomasevic, Alexandre Boyer, Sonia Ben Dhia:
Bandgap failure study due to parasitic bipolar substrate coupling in Smart Power mixed ICs. EMC Compo 2015: 34-38 - 2014
- [c6]Sonia Ben Dhia, Alexandre Boyer:
Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing. LATW 2014: 1-6 - 2013
- [c5]Alexandre Boyer, Sonia Ben Dhia:
Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission. EMC Compo 2013: 190-195 - [c4]Sonia Ben Dhia, Alexandre Boyer:
Electro-magnetic robustness of integrated circuits: from statement to prediction. EMC Compo 2013: 208-213 - [c3]Alexandre Boyer, Sonia Ben Dhia:
Effect of aging on power integrity of digital integrated circuits. LATW 2013: 1-5 - 2011
- [c2]Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon:
Prediction of long-term immunity of a phase-locked loop. LATW 2011: 1-6 - [c1]Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro:
IC immunity modeling process validation using on-chip measurements. LATW 2011: 1-6
Coauthor Index
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